Electric field broadening of gallium acceptor states in compensated Ge:Ga,As

K. M. Itoh, W. Walukiewicz, J. W. Beeman, E. E. Haller, Hyunjung Kim, A. J. Mayur, M. D. Sciacca, A. K. Ramdas, R. Buczko, J. W. Farmer, V. I. Ozhogin

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)

Abstract

We report on low-temperature infrared absorption spectroscopy studies of p-type Ge:Ga,As samples with varying doping compensation ratios. Previous difficulties in fabricating appropriate samples are overcome by applying the neutron transmutation doping technique to high purity germanium of isotopically controlled composition with 70Ge and 74Ge. With this technique, we have produced a series of crystals with compensation ratios between 0.082 and 0.87 while maintaining the net-acceptor concentration [Ga]-[As] constant at 5×1014cm-3. The observed Ga impurity absorption peaks broaden linearly with the ionized impurity concentration due to the quadrupole interactions between Ga bound holes and the electric field gradient. Experimental linewidths are quantitatively compared to existing theories of electric field broadening for donor 1s-2p transitions. We find excellent agreement with the theory which is based on the correlated distribution of ionized impurity centers.

Original languageEnglish
Pages (from-to)127-132
Number of pages6
JournalMaterials Science Forum
Volume196-201
Issue numberpt 1
Publication statusPublished - 1995 Dec 1
EventProceedings of the 1995 18th International Conference on Defects in Semiconductors, ICDS-18. Part 1 (of 4) - Sendai, Jpn
Duration: 1995 Jul 231995 Jul 28

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Electric field broadening of gallium acceptor states in compensated Ge:Ga,As'. Together they form a unique fingerprint.

Cite this