Electrical resistivity in thin film of reentrant spin glass NiMn

T. Sato, N. Yoneyama, Y. Torii, T. Ando

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Electrical resistivity in thin films of disordered NiMn shows a minimum at Tmin which correlates with the spin glass transition temperature Tg. The signs of the film thickness dependence of Tmin are opposite for two Mn concentrations which are larger and smaller than the multicritical-point concentration (23.9 at% Mn).

Original languageEnglish
Pages (from-to)349-350
Number of pages2
JournalJournal of Magnetism and Magnetic Materials
Volume90-91
DOIs
Publication statusPublished - 1990

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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