Element-selective vertical height determination for an organic monolayer by a scanned-energy photoelectron-yield soft x-ray standing wave technique

Hiroshi Kondoh, R. Yokota, K. Amemiya, T. Shimada, I. Nakai, M. Nagasaka, T. Ohta, T. Nakamura, H. Takenaka

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A photoelectron-yield soft x-ray standing wave (SW) technique with the scanned-energy mode has been applied to the vertical height determination of the atoms of specific elements involved in an organic monolayer prepared by the Langmuir-Blodgett method on a WC superlattice substrate (d=30.9 Å) that serves as a SW generator. The vertical positions of two different-element atoms were determined from the SW profiles. This kind of information is complementary to the molecular-orientation estimation by the polarized x-ray absorption spectroscopy and the combination of these techniques will be a powerful tool to understand the structures of organic monolayers.

Original languageEnglish
Article number031911
JournalApplied Physics Letters
Volume87
Issue number3
DOIs
Publication statusPublished - 2005 Jul 18
Externally publishedYes

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standing waves
photoelectrons
x rays
x ray absorption
x ray spectroscopy
atoms
energy
absorption spectroscopy
generators
profiles

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Element-selective vertical height determination for an organic monolayer by a scanned-energy photoelectron-yield soft x-ray standing wave technique. / Kondoh, Hiroshi; Yokota, R.; Amemiya, K.; Shimada, T.; Nakai, I.; Nagasaka, M.; Ohta, T.; Nakamura, T.; Takenaka, H.

In: Applied Physics Letters, Vol. 87, No. 3, 031911, 18.07.2005.

Research output: Contribution to journalArticle

Kondoh, Hiroshi ; Yokota, R. ; Amemiya, K. ; Shimada, T. ; Nakai, I. ; Nagasaka, M. ; Ohta, T. ; Nakamura, T. ; Takenaka, H. / Element-selective vertical height determination for an organic monolayer by a scanned-energy photoelectron-yield soft x-ray standing wave technique. In: Applied Physics Letters. 2005 ; Vol. 87, No. 3.
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