Element-selective vertical height determination for an organic monolayer by a scanned-energy photoelectron-yield soft x-ray standing wave technique

H. Kondoh, R. Yokota, K. Amemiya, T. Shimada, I. Nakai, M. Nagasaka, T. Ohta, T. Nakamura, H. Takenaka

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Fingerprint Dive into the research topics of 'Element-selective vertical height determination for an organic monolayer by a scanned-energy photoelectron-yield soft x-ray standing wave technique'. Together they form a unique fingerprint.

Physics & Astronomy