Energy dispersive near edge X-ray absorption fine structure in the soft X-ray region: A new technique to investigate surface reactions

K. Amemiya, H. Kondoh, A. Nambu, M. Iwasaki, I. Nakai, T. Yokoyama, T. Ohta

Research output: Contribution to journalArticle

13 Citations (Scopus)


A novel technique, energy dispersive near edge X-ray absorption tine structure (NEXAFS) spectroscopy, has been successfully developed by using a position sensitive electron analyzer and a new soft X-ray beamline constructed at the bending magnet in the Photon Factory. It was revealed that the NEXAFS spectra can be obtained even for submonolayer adsorbates with an accumulation period of ∼ 30 s. As the first application of the new technique, coverage dependence of C-K-edge NEXAFS spectra were recorded in situ for thiophene adsorption on Au(111).

Original languageEnglish
Pages (from-to)L718-L720
JournalJapanese Journal of Applied Physics, Part 2: Letters
Issue number7 B
Publication statusPublished - 2001 Jul 15
Externally publishedYes



  • Energy dispersive method
  • Soft X-ray
  • Surface chemical reaction
  • Thiophene

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

Cite this