Fingerprint Dive into the research topics of 'Enhanced hole drift velocity in sub-0.1μm Si devices caused by anisotropic velocity overshoot'. Together they form a unique fingerprint.
- Sort by
- Weight
- Alphabetically
Enhanced hole drift velocity in sub-0.1μm Si devices caused by anisotropic velocity overshoot
Yukio Tagawa, Yuji Awano
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
1
Citation
(Scopus)