Enhanced hole drift velocity in sub-0.1μm Si devices caused by anisotropic velocity overshoot

Yukio Tagawa, Yuji Awano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Fingerprint Dive into the research topics of 'Enhanced hole drift velocity in sub-0.1μm Si devices caused by anisotropic velocity overshoot'. Together they form a unique fingerprint.

Mathematics

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy