Exchange bias in Pt doped NiMn thick films

Y. Öner, M. Özdemir, S. Kazan, A. C. Basaran, B. Aktas, Tetsuya Sato

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Magnetization and electron spin resonance (ESR) measurements were carried out on a 1.2 at. % Pt doped NiMn thin film (8000 Å) in the temperature range of 5-200 K for both parallel (field parallel to the film surface) and perpendicular configurations. M versus H loops were recorded at selected temperatures. Magnetization curves in the parallel configuration differ from those in the perpendicular geometry in many respects, including the anisotropy fields derived from these curves, and the coercivity. In addition, the temperature dependences of the magnetization in a small negative field (-0.5 Oe) and several larger positive fields will also be reported. All of these phenomena can be understood by the coexistence of Mn-rich and Mn-deficient aggregated granular regions coupled antiferromagnetically. Furthermore, the exchange stiffness constant (D), bulk anisotropy constant, and surface anisotropy constant were deduced from ESR measurements. The fitted ESR parameters are in good agreement with the behavior deduced from magnetization.

Original languageEnglish
Article number09E104
JournalJournal of Applied Physics
Volume107
Issue number9
DOIs
Publication statusPublished - 2010 May 1

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thick films
electron paramagnetic resonance
magnetization
anisotropy
curves
configurations
coercivity
stiffness
temperature dependence
temperature
thin films
geometry

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Öner, Y., Özdemir, M., Kazan, S., Basaran, A. C., Aktas, B., & Sato, T. (2010). Exchange bias in Pt doped NiMn thick films. Journal of Applied Physics, 107(9), [09E104]. https://doi.org/10.1063/1.3364049

Exchange bias in Pt doped NiMn thick films. / Öner, Y.; Özdemir, M.; Kazan, S.; Basaran, A. C.; Aktas, B.; Sato, Tetsuya.

In: Journal of Applied Physics, Vol. 107, No. 9, 09E104, 01.05.2010.

Research output: Contribution to journalArticle

Öner, Y, Özdemir, M, Kazan, S, Basaran, AC, Aktas, B & Sato, T 2010, 'Exchange bias in Pt doped NiMn thick films', Journal of Applied Physics, vol. 107, no. 9, 09E104. https://doi.org/10.1063/1.3364049
Öner Y, Özdemir M, Kazan S, Basaran AC, Aktas B, Sato T. Exchange bias in Pt doped NiMn thick films. Journal of Applied Physics. 2010 May 1;107(9). 09E104. https://doi.org/10.1063/1.3364049
Öner, Y. ; Özdemir, M. ; Kazan, S. ; Basaran, A. C. ; Aktas, B. ; Sato, Tetsuya. / Exchange bias in Pt doped NiMn thick films. In: Journal of Applied Physics. 2010 ; Vol. 107, No. 9.
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