Experimental prediction of wavelength dependence of optical path length for optical intrinsic signal analysis

K. Sakaguchi, Furukawa, T. Katsura, A. Maki, K. Yamazaki, H. Kawaguchi, E. Okada

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    The wavelength dependence of the optical path length is experimentally estimated from the multi-spectral reflectance. The proposed method is applied to the path length correction in optical intrinsic signal analysis of the exposed cortex.

    Original languageEnglish
    Title of host publication19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages601-602
    Number of pages2
    ISBN (Print)0780395557, 9780780395558
    DOIs
    Publication statusPublished - 2006 Jan 1
    Event19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS - Montreal, QC, Canada
    Duration: 2006 Oct 292006 Nov 2

    Publication series

    NameConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
    ISSN (Print)1092-8081

    Other

    Other19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
    CountryCanada
    CityMontreal, QC
    Period06/10/2906/11/2

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

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