Experimental prediction of wavelength dependence of optical path length for optical intrinsic signal analysis

K. Sakaguchi, Furukawa, T. Katsura, A. Maki, K. Yamazaki, H. Kawaguchi, E. Okada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The wavelength dependence of the optical path length is experimentally estimated from the multi-spectral reflectance. The proposed method is applied to the path length correction in optical intrinsic signal analysis of the exposed cortex.

Original languageEnglish
Title of host publication19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages601-602
Number of pages2
ISBN (Print)0780395557, 9780780395558
DOIs
Publication statusPublished - 2006 Jan 1
Event19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS - Montreal, QC, Canada
Duration: 2006 Oct 292006 Nov 2

Publication series

NameConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
ISSN (Print)1092-8081

Other

Other19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
CountryCanada
CityMontreal, QC
Period06/10/2906/11/2

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Sakaguchi, K., Furukawa, Katsura, T., Maki, A., Yamazaki, K., Kawaguchi, H., & Okada, E. (2006). Experimental prediction of wavelength dependence of optical path length for optical intrinsic signal analysis. In 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS (pp. 601-602). [4054327] (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/LEOS.2006.278820