Experimental study of biaxial and uniaxial strain effects on carrier mobility in bulk and ultrathin-body SOI MOSFETs

Ken Uchida, Ricardo Zednik, Ching Huang Lu, Hemanth Jagannathan, James McVittie, Paul C. McIntyre, Yoshio Nishi

    Research output: Contribution to journalConference articlepeer-review

    75 Citations (Scopus)

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    Physics & Astronomy

    Chemical Compounds

    Engineering & Materials Science