Experimental study on nanoscale temperature measurement method using rotation of near-field polarization

Jumpei Nitta, Sho Kishimoto, Yoshihiro Taguchi, Toshiharu Saiki, Yuji Nagasaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A novel nanoscale temperature measurement system using polarized near-field light which enables the high spatial resolution at nanoscale has been developed. In this measurement system, the temperature dependence of the rotation of the polarization plane in near field is detected. However, the signal light variation is extremely weak, therefore, more sensitive measurement system is required. In this paper, we proposed a novel high sensitive nanoscale temperature measurement method. In addition, this paper reports the analytical and experimental results by using platinum nanostructures in order to confirm the validity of the measurement principle.

Original languageEnglish
Title of host publicationOptical MEMS and Nanophotonics 2013, OMN 2013 - Proceedings
Pages41-42
Number of pages2
DOIs
Publication statusPublished - 2013 Dec 1
Event2013 International Conference on Optical MEMS and Nanophotonics, OMN 2013 - Kanazawa, Japan
Duration: 2013 Aug 182013 Aug 22

Publication series

NameInternational Conference on Optical MEMS and Nanophotonics
ISSN (Print)2160-5033
ISSN (Electronic)2160-5041

Other

Other2013 International Conference on Optical MEMS and Nanophotonics, OMN 2013
Country/TerritoryJapan
CityKanazawa
Period13/8/1813/8/22

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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