TY - GEN
T1 - Exponential Superimposed Renewal Processes
AU - Yamamoto, Watalu
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/8
Y1 - 2020/8
N2 - Superimposed renewal processes arise when the events from multiple renewal processes and all labels, which allow us to identify where they have come from, are missing. In reliability engineering, individual renewal processes are stochastic failure time models for components, and the superimposed renewal process from them is the model for the system failure times. Labels are the identity information of individual failures, such as the serial number of the failed component, or the most recent failure time. When these labels are missing, it is challenging to conduct statistical inference on renewal processes because of the loss of information on identities. Recently a likelihood-based method is proposed under the assumption that all renewal processes under a superimposed process are homogeneous. This paper discusses the argument used in the method and tries to extend it for heterogeneous cases.
AB - Superimposed renewal processes arise when the events from multiple renewal processes and all labels, which allow us to identify where they have come from, are missing. In reliability engineering, individual renewal processes are stochastic failure time models for components, and the superimposed renewal process from them is the model for the system failure times. Labels are the identity information of individual failures, such as the serial number of the failed component, or the most recent failure time. When these labels are missing, it is challenging to conduct statistical inference on renewal processes because of the loss of information on identities. Recently a likelihood-based method is proposed under the assumption that all renewal processes under a superimposed process are homogeneous. This paper discusses the argument used in the method and tries to extend it for heterogeneous cases.
KW - component
KW - EM algorithm
KW - incomplete data
KW - label missing
KW - stationary renewal processes
KW - superposition
UR - http://www.scopus.com/inward/record.url?scp=85093975331&partnerID=8YFLogxK
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U2 - 10.1109/APARM49247.2020.9209456
DO - 10.1109/APARM49247.2020.9209456
M3 - Conference contribution
AN - SCOPUS:85093975331
T3 - 2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020
BT - 2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020
Y2 - 20 August 2020 through 23 August 2020
ER -