Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis

Suguru Kanoga, Yasue Mitsukura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

To study an eye blink artifact rejection scheme from single-channel electroencephalographic (EEG) signals has been now a major challenge in the field of EEG signal processing. High removal performance is still needed to more strictly investigate pattern of EEG features. This paper proposes a new eye blink artifact rejection scheme from single-channel EEG signals by combining complete ensemble empirical mode decomposition (CEEMD) and independent component analysis (ICA). We compare the separation performance of our proposed scheme with existing schemes (wavelet-ICA, EMD-ICA, and EEMD-ICA) though real-life data by using signal-to-noise ratio. As a result, CEEMD-ICA showed high performance (11.86 dB) than all other schemes (10.78, 10.59, and 11.30 dB) in the ability of eye blink artifact removal.

Original languageEnglish
Title of host publicationProceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages121-124
Number of pages4
Volume2015-November
ISBN (Print)9781424492718
DOIs
Publication statusPublished - 2015 Nov 4
Event37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015 - Milan, Italy
Duration: 2015 Aug 252015 Aug 29

Other

Other37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015
CountryItaly
CityMilan
Period15/8/2515/8/29

Fingerprint

Independent component analysis
Artifacts
Decomposition
Signal-To-Noise Ratio
Signal to noise ratio
Signal processing

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Signal Processing
  • Biomedical Engineering
  • Health Informatics

Cite this

Kanoga, S., & Mitsukura, Y. (2015). Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis. In Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS (Vol. 2015-November, pp. 121-124). [7318315] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EMBC.2015.7318315

Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis. / Kanoga, Suguru; Mitsukura, Yasue.

Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS. Vol. 2015-November Institute of Electrical and Electronics Engineers Inc., 2015. p. 121-124 7318315.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kanoga, S & Mitsukura, Y 2015, Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis. in Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS. vol. 2015-November, 7318315, Institute of Electrical and Electronics Engineers Inc., pp. 121-124, 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015, Milan, Italy, 15/8/25. https://doi.org/10.1109/EMBC.2015.7318315
Kanoga S, Mitsukura Y. Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis. In Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS. Vol. 2015-November. Institute of Electrical and Electronics Engineers Inc. 2015. p. 121-124. 7318315 https://doi.org/10.1109/EMBC.2015.7318315
Kanoga, Suguru ; Mitsukura, Yasue. / Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis. Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS. Vol. 2015-November Institute of Electrical and Electronics Engineers Inc., 2015. pp. 121-124
@inproceedings{399721006fb24412956d511b58f09dca,
title = "Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis",
abstract = "To study an eye blink artifact rejection scheme from single-channel electroencephalographic (EEG) signals has been now a major challenge in the field of EEG signal processing. High removal performance is still needed to more strictly investigate pattern of EEG features. This paper proposes a new eye blink artifact rejection scheme from single-channel EEG signals by combining complete ensemble empirical mode decomposition (CEEMD) and independent component analysis (ICA). We compare the separation performance of our proposed scheme with existing schemes (wavelet-ICA, EMD-ICA, and EEMD-ICA) though real-life data by using signal-to-noise ratio. As a result, CEEMD-ICA showed high performance (11.86 dB) than all other schemes (10.78, 10.59, and 11.30 dB) in the ability of eye blink artifact removal.",
author = "Suguru Kanoga and Yasue Mitsukura",
year = "2015",
month = "11",
day = "4",
doi = "10.1109/EMBC.2015.7318315",
language = "English",
isbn = "9781424492718",
volume = "2015-November",
pages = "121--124",
booktitle = "Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS",
publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - GEN

T1 - Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis

AU - Kanoga, Suguru

AU - Mitsukura, Yasue

PY - 2015/11/4

Y1 - 2015/11/4

N2 - To study an eye blink artifact rejection scheme from single-channel electroencephalographic (EEG) signals has been now a major challenge in the field of EEG signal processing. High removal performance is still needed to more strictly investigate pattern of EEG features. This paper proposes a new eye blink artifact rejection scheme from single-channel EEG signals by combining complete ensemble empirical mode decomposition (CEEMD) and independent component analysis (ICA). We compare the separation performance of our proposed scheme with existing schemes (wavelet-ICA, EMD-ICA, and EEMD-ICA) though real-life data by using signal-to-noise ratio. As a result, CEEMD-ICA showed high performance (11.86 dB) than all other schemes (10.78, 10.59, and 11.30 dB) in the ability of eye blink artifact removal.

AB - To study an eye blink artifact rejection scheme from single-channel electroencephalographic (EEG) signals has been now a major challenge in the field of EEG signal processing. High removal performance is still needed to more strictly investigate pattern of EEG features. This paper proposes a new eye blink artifact rejection scheme from single-channel EEG signals by combining complete ensemble empirical mode decomposition (CEEMD) and independent component analysis (ICA). We compare the separation performance of our proposed scheme with existing schemes (wavelet-ICA, EMD-ICA, and EEMD-ICA) though real-life data by using signal-to-noise ratio. As a result, CEEMD-ICA showed high performance (11.86 dB) than all other schemes (10.78, 10.59, and 11.30 dB) in the ability of eye blink artifact removal.

UR - http://www.scopus.com/inward/record.url?scp=84953248977&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84953248977&partnerID=8YFLogxK

U2 - 10.1109/EMBC.2015.7318315

DO - 10.1109/EMBC.2015.7318315

M3 - Conference contribution

C2 - 26736215

AN - SCOPUS:84953248977

SN - 9781424492718

VL - 2015-November

SP - 121

EP - 124

BT - Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS

PB - Institute of Electrical and Electronics Engineers Inc.

ER -