Abstract
To study an eye blink artifact rejection scheme from single-channel electroencephalographic (EEG) signals has been now a major challenge in the field of EEG signal processing. High removal performance is still needed to more strictly investigate pattern of EEG features. This paper proposes a new eye blink artifact rejection scheme from single-channel EEG signals by combining complete ensemble empirical mode decomposition (CEEMD) and independent component analysis (ICA). We compare the separation performance of our proposed scheme with existing schemes (wavelet-ICA, EMD-ICA, and EEMD-ICA) though real-life data by using signal-to-noise ratio. As a result, CEEMD-ICA showed high performance (11.86 dB) than all other schemes (10.78, 10.59, and 11.30 dB) in the ability of eye blink artifact removal.
| Original language | English |
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| Title of host publication | Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 121-124 |
| Number of pages | 4 |
| Volume | 2015-November |
| ISBN (Print) | 9781424492718 |
| DOIs | |
| Publication status | Published - 2015 Nov 4 |
| Event | 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015 - Milan, Italy Duration: 2015 Aug 25 → 2015 Aug 29 |
Other
| Other | 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015 |
|---|---|
| Country/Territory | Italy |
| City | Milan |
| Period | 15/8/25 → 15/8/29 |
ASJC Scopus subject areas
- Computer Vision and Pattern Recognition
- Signal Processing
- Biomedical Engineering
- Health Informatics