@article{d6d66e5c468940e18e58aebfe366deb0,
title = "Fast Bayesian Tomography of a Two-Qubit Gate Set in Silicon",
abstract = "Benchmarking and characterizing quantum states and logic gates is essential in the development of devices for quantum computing. We introduce a Bayesian approach to self-consistent process tomography, called fast Bayesian tomography (FBT), and experimentally demonstrate its performance in characterizing a two-qubit gate set on a silicon-based spin qubit device. FBT is built on an adaptive self-consistent linearization that is robust to model approximation errors. Our method offers several advantages over other self-consistent tomographic methods. Most notably, FBT can leverage prior information from randomized benchmarking (or other characterization measurements), and can be performed in real time, providing continuously updated estimates of full process matrices while data are acquired.",
author = "Evans, {T. J.} and W. Huang and J. Yoneda and R. Harper and T. Tanttu and Chan, {K. W.} and Hudson, {F. E.} and Itoh, {K. M.} and A. Saraiva and Yang, {C. H.} and Dzurak, {A. S.} and Bartlett, {S. D.}",
note = "Funding Information: We thank Steve Flammia, Thomas Smith, Owen Dillon, Thaddeus Ladd, and Matthew Otten for helpful discussions. This work was supported by the Australian Research Council via EQUS Project No. CE170100009, CQC2T Project No. CE170100012, and Laureate Fellowship Project No. FL190100167. R.H. acknowledges support from the Sydney Quantum Academy. We acknowledge support by the NSW Node of the Australian National Fabrication Facility. We also acknowledge support from the U.S. Army Research Office Grant No. W911NF-17-1-0198. The views and conclusions contained in this paper are those of the authors and should not be interpreted as representing the official policies, either expressed or implied, of the Army Research Office or the U.S. Government. Publisher Copyright: {\textcopyright} 2022 American Physical Society. ",
year = "2022",
month = feb,
doi = "10.1103/PhysRevApplied.17.024068",
language = "English",
volume = "17",
journal = "Physical Review Applied",
issn = "2331-7019",
publisher = "American Physical Society",
number = "2",
}