FDTD analysis of a near-field optical fiber probe with a double tapered structure

Keiji Sawada, Hiroaki Nakamura, Hirotomo Kambe, Toshiharu Saiki

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Using the finite-difference time-domain method, we evaluated the performance of apertured near-field fiber probes with a double-tapered structure, which have exhibited, in recent experiments, a much higher collection efficiency of localized light in comparison with single-tapered probes. We clarified that this high collection efficiency could be attributed to the shortening of the cutoff region, and the efficient coupling to the guiding mode of the optical fiber. By reproducing the experimental results in terms of the spatial resolution and the collection efficiency as a function of the aperture diameter, our calculation was confirmed to be valid and useful for the design of probes in a variety of applications.

Original languageEnglish
Pages (from-to)2055-2058
Number of pages4
JournalIEICE Transactions on Electronics
VolumeE85-C
Issue number12 SPEC.
Publication statusPublished - 2002 Dec

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Optical fibers
Finite difference time domain method
Fibers
Experiments

Keywords

  • Collection efficiency
  • Double-tapered probe
  • FDTD
  • Near-field scanning optical microscopy
  • Spatial resolution

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

FDTD analysis of a near-field optical fiber probe with a double tapered structure. / Sawada, Keiji; Nakamura, Hiroaki; Kambe, Hirotomo; Saiki, Toshiharu.

In: IEICE Transactions on Electronics, Vol. E85-C, No. 12 SPEC., 12.2002, p. 2055-2058.

Research output: Contribution to journalArticle

Sawada, K, Nakamura, H, Kambe, H & Saiki, T 2002, 'FDTD analysis of a near-field optical fiber probe with a double tapered structure', IEICE Transactions on Electronics, vol. E85-C, no. 12 SPEC., pp. 2055-2058.
Sawada, Keiji ; Nakamura, Hiroaki ; Kambe, Hirotomo ; Saiki, Toshiharu. / FDTD analysis of a near-field optical fiber probe with a double tapered structure. In: IEICE Transactions on Electronics. 2002 ; Vol. E85-C, No. 12 SPEC. pp. 2055-2058.
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