Finite element damage analyses for predictions of creep crack growth

Chang Sik Oh, Nak Hyun Kim, Sung Hwan Min, Yun Jae Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

This paper provides the virtual simulation method for creep crack growth test, based on finite element (FE) analyses with damage mechanics. Creep tests of smooth bars are used to quantify the constants of creep constitutive equation. the reduction of area resulting from creep tests of smooth and notched bar is adopted as a measure of creep ductility under multiaxial stress conditions. the creep ductility exhaustion concept is adopted for calculating creep damage, which is defined as the ratio of creep strain to the multiaxial creep ductility. To simulate crack propagation, fully damaged elements are forced to have nearly zero stresses using userdefined subroutine UHARD in the general-purpose FE code, ABAQUS. the results from 2D or 3D FE analyses are compared with experimental data of creep crack growth. It is shown that the predictions obtained from this new method are in good agreement with experimental data.

Original languageEnglish
Title of host publicationAmerican Society of Mechanical Engineers, Pressure Vessels and Piping Division (Publication) PVP
Pages331-335
Number of pages5
DOIs
Publication statusPublished - 2010 Dec 1
Externally publishedYes
EventASME 2010 Pressure Vessels and Piping Division/K-PVP Conference, PVP2010 - Bellevue, WA, United States
Duration: 2010 Jul 182010 Jul 22

Publication series

NameAmerican Society of Mechanical Engineers, Pressure Vessels and Piping Division (Publication) PVP
Volume6
ISSN (Print)0277-027X

Other

OtherASME 2010 Pressure Vessels and Piping Division/K-PVP Conference, PVP2010
Country/TerritoryUnited States
CityBellevue, WA
Period10/7/1810/7/22

ASJC Scopus subject areas

  • Mechanical Engineering

Fingerprint

Dive into the research topics of 'Finite element damage analyses for predictions of creep crack growth'. Together they form a unique fingerprint.

Cite this