Abstract
We apply the theory of the magneto-optic Kerr effect (MOKE) for multilayer thin films to analyze the surface magnetic properties, which have been observed using focused MOKE, for Ni75Fe25 and Fe thin films evaporated on poly(ethylene naphthalate) (PEN) organic substrates. The calculation is performed for the thickness dependence and incident angle dependence of Kerr rotation and ellipticity. We have measured the thickness dependence of Kerr rotation at a wavelength of 405nm for both Ni 75Fe25 and Fe thin films on PEN organic substrates. These results are fitted using the theory by adjusting the values of magneto-optic constants Q's. These Q's are 0.01 exp(-i48π=180) and 0.025 exp(-i47π=180) for Ni75Fe25 and Fe thin films, respectively. These results lead to the quantitative estimation of the surface magnetic properties of thin films on organic substrates. Also, the magneto-optic constants are estimated for ferromagnetic thin films on organic substrates for the first time.
| Original language | English |
|---|---|
| Article number | 013001 |
| Journal | Japanese journal of applied physics |
| Volume | 52 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2013 Jan 1 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)
Cite this
Focused magneto-optic kerr effect spectroscopy in Ni75Fe 25 and Fe ferromagnetic thin films on organic substrates. / Kondo, Kenji; Kaiju, Hideo; Ishibashi, Akira.
In: Japanese journal of applied physics, Vol. 52, No. 1, 013001, 01.01.2013.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Focused magneto-optic kerr effect spectroscopy in Ni75Fe 25 and Fe ferromagnetic thin films on organic substrates
AU - Kondo, Kenji
AU - Kaiju, Hideo
AU - Ishibashi, Akira
PY - 2013/1/1
Y1 - 2013/1/1
N2 - We apply the theory of the magneto-optic Kerr effect (MOKE) for multilayer thin films to analyze the surface magnetic properties, which have been observed using focused MOKE, for Ni75Fe25 and Fe thin films evaporated on poly(ethylene naphthalate) (PEN) organic substrates. The calculation is performed for the thickness dependence and incident angle dependence of Kerr rotation and ellipticity. We have measured the thickness dependence of Kerr rotation at a wavelength of 405nm for both Ni 75Fe25 and Fe thin films on PEN organic substrates. These results are fitted using the theory by adjusting the values of magneto-optic constants Q's. These Q's are 0.01 exp(-i48π=180) and 0.025 exp(-i47π=180) for Ni75Fe25 and Fe thin films, respectively. These results lead to the quantitative estimation of the surface magnetic properties of thin films on organic substrates. Also, the magneto-optic constants are estimated for ferromagnetic thin films on organic substrates for the first time.
AB - We apply the theory of the magneto-optic Kerr effect (MOKE) for multilayer thin films to analyze the surface magnetic properties, which have been observed using focused MOKE, for Ni75Fe25 and Fe thin films evaporated on poly(ethylene naphthalate) (PEN) organic substrates. The calculation is performed for the thickness dependence and incident angle dependence of Kerr rotation and ellipticity. We have measured the thickness dependence of Kerr rotation at a wavelength of 405nm for both Ni 75Fe25 and Fe thin films on PEN organic substrates. These results are fitted using the theory by adjusting the values of magneto-optic constants Q's. These Q's are 0.01 exp(-i48π=180) and 0.025 exp(-i47π=180) for Ni75Fe25 and Fe thin films, respectively. These results lead to the quantitative estimation of the surface magnetic properties of thin films on organic substrates. Also, the magneto-optic constants are estimated for ferromagnetic thin films on organic substrates for the first time.
UR - http://www.scopus.com/inward/record.url?scp=84872312426&partnerID=8YFLogxK
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U2 - 10.7567/JJAP.52.013001
DO - 10.7567/JJAP.52.013001
M3 - Article
VL - 52
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 1
M1 - 013001
ER -