Hall-effect Measurement of Organic Semiconductor Layers Using Micro-scale Electrode Chips

Kei Noda, Kazumi Matsushige, Akira Sugawara, Yasuo Wada, Tsutomu Watahiki, Takahiro Kiyosu

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

A new micro-electrode structure for Hall-effect measurements of organic semiconductor layers was proposed. The equations for the Hall-effect measurements based on the van der Pauw method indicate that narrower electrode gaps can decrease the resistance between contact points and enable Hall-effect measurement even for higher resistance materials such as organic semiconductors. According to this “scaling rule”, we fabricated a new electrode chip which consists of four small finger electrodes with a gap of micrometer-scale between diagonally opposite electrodes. In order to demonstrate the validity of this concept, Hall-effect measurements for FeCl3-doped poly(3,4-ethylenedioxythiophene) (PEDOT) was performed using this new electrode structure, revealing that a 10-µm-gap electrode chip is effective for evaluating carrier concentration of down to around 1019 cm-3. These Hall electrode chips are quite useful for quantitative analysis of carrier concentration and ca rier mobility in organic semiconductor materials.

Original languageEnglish
Pages (from-to)1398-1401
Number of pages4
JournalIEEJ Transactions on Electronics, Information and Systems
Volume132
Issue number9
DOIs
Publication statusPublished - 2012
Externally publishedYes

Fingerprint

Semiconducting organic compounds
Hall effect
Electrodes
Carrier concentration
Point contacts
Contact resistance
Semiconductor materials
Chemical analysis

Keywords

  • carrier concentration
  • Hall-effect measurement
  • micro-scale gap electrode
  • organic semiconductor
  • PEDOT

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Hall-effect Measurement of Organic Semiconductor Layers Using Micro-scale Electrode Chips. / Noda, Kei; Matsushige, Kazumi; Sugawara, Akira; Wada, Yasuo; Watahiki, Tsutomu; Kiyosu, Takahiro.

In: IEEJ Transactions on Electronics, Information and Systems, Vol. 132, No. 9, 2012, p. 1398-1401.

Research output: Contribution to journalArticle

Noda, Kei ; Matsushige, Kazumi ; Sugawara, Akira ; Wada, Yasuo ; Watahiki, Tsutomu ; Kiyosu, Takahiro. / Hall-effect Measurement of Organic Semiconductor Layers Using Micro-scale Electrode Chips. In: IEEJ Transactions on Electronics, Information and Systems. 2012 ; Vol. 132, No. 9. pp. 1398-1401.
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