Hard x-ray photoelectron spectroscopy using an environmental cell with silicon nitride membrane windows

Eika Tsunemi; Yoshio Watanabe; Hiroshi Oji; Yi Tao Cui; Jin Young Son; Atsushi Nakajima

doi:10.1063/1.4922335

Hard x-ray photoelectron spectroscopy using an environmental cell with silicon nitride membrane windows

Eika Tsunemi, Yoshio Watanabe, Hiroshi Oji, Yi Tao Cui, Jin Young Son, Atsushi Nakajima

Department of Chemistry

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

Abstract

We applied hard x-ray photoelectron spectroscopy (HAXPES) to a sample under ambient pressure conditions using an environmental cell with an approximately 24 nm-thick SiN<inf>x</inf> membrane window. As a model chemical substance, europium (II) iodide (EuI<inf>2</inf>) sealed in the cell with argon gas was investigated with HAXPES to identify the chemical species present inside the cell. The optical and morphological properties of the sample within the cell were measured with optical and fluorescent microscopy, scanning electron microscopy, cathodoluminescence, and energy dispersive x-ray spectrometry. We confirmed the effectiveness of the gas barrier properties of the cell with the SiN<inf>x</inf> window and demonstrated its applicability to various other optical and electron measurements as well as HAXPES.

Original language	English
Article number	234902
Journal	Journal of Applied Physics
Volume	117
Issue number	23
DOIs	https://doi.org/10.1063/1.4922335
Publication status	Published - 2015 Jun 21

ASJC Scopus subject areas

Physics and Astronomy(all)

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@article{59443a690d65422c8163c926c186aef5,

title = "Hard x-ray photoelectron spectroscopy using an environmental cell with silicon nitride membrane windows",

abstract = "We applied hard x-ray photoelectron spectroscopy (HAXPES) to a sample under ambient pressure conditions using an environmental cell with an approximately 24 nm-thick SiNx membrane window. As a model chemical substance, europium (II) iodide (EuI2) sealed in the cell with argon gas was investigated with HAXPES to identify the chemical species present inside the cell. The optical and morphological properties of the sample within the cell were measured with optical and fluorescent microscopy, scanning electron microscopy, cathodoluminescence, and energy dispersive x-ray spectrometry. We confirmed the effectiveness of the gas barrier properties of the cell with the SiNx window and demonstrated its applicability to various other optical and electron measurements as well as HAXPES.",

author = "Eika Tsunemi and Yoshio Watanabe and Hiroshi Oji and Cui, {Yi Tao} and Son, {Jin Young} and Atsushi Nakajima",

year = "2015",

month = jun,

day = "21",

doi = "10.1063/1.4922335",

language = "English",

volume = "117",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "23",

}

TY - JOUR

T1 - Hard x-ray photoelectron spectroscopy using an environmental cell with silicon nitride membrane windows

AU - Tsunemi, Eika

AU - Watanabe, Yoshio

AU - Oji, Hiroshi

AU - Cui, Yi Tao

AU - Son, Jin Young

AU - Nakajima, Atsushi

PY - 2015/6/21

Y1 - 2015/6/21

N2 - We applied hard x-ray photoelectron spectroscopy (HAXPES) to a sample under ambient pressure conditions using an environmental cell with an approximately 24 nm-thick SiNx membrane window. As a model chemical substance, europium (II) iodide (EuI2) sealed in the cell with argon gas was investigated with HAXPES to identify the chemical species present inside the cell. The optical and morphological properties of the sample within the cell were measured with optical and fluorescent microscopy, scanning electron microscopy, cathodoluminescence, and energy dispersive x-ray spectrometry. We confirmed the effectiveness of the gas barrier properties of the cell with the SiNx window and demonstrated its applicability to various other optical and electron measurements as well as HAXPES.

AB - We applied hard x-ray photoelectron spectroscopy (HAXPES) to a sample under ambient pressure conditions using an environmental cell with an approximately 24 nm-thick SiNx membrane window. As a model chemical substance, europium (II) iodide (EuI2) sealed in the cell with argon gas was investigated with HAXPES to identify the chemical species present inside the cell. The optical and morphological properties of the sample within the cell were measured with optical and fluorescent microscopy, scanning electron microscopy, cathodoluminescence, and energy dispersive x-ray spectrometry. We confirmed the effectiveness of the gas barrier properties of the cell with the SiNx window and demonstrated its applicability to various other optical and electron measurements as well as HAXPES.

UR - http://www.scopus.com/inward/record.url?scp=84935029491&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84935029491&partnerID=8YFLogxK

U2 - 10.1063/1.4922335

DO - 10.1063/1.4922335

M3 - Article

AN - SCOPUS:84935029491

VL - 117

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 23

M1 - 234902

ER -

Hard x-ray photoelectron spectroscopy using an environmental cell with silicon nitride membrane windows

Abstract

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