High accuracy analysis method for 3D nanoscale deformation / fracture characteristics inside a material

Mitsuru Nakazawa, Masakazu Kobayashi, Hiroyuki Toda, Yoshimitsu Aoki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

To evaluate internal thorough material characteristics in deformation, we proposed an analysis method which obtains displacement vectors of dispersed particles between deformation from nano-order 3D-CT images. In this paper, we introduce an improved approach to achieve more robust matching and eliminate the need to tune some parameters. To confirm the effectiveness of the improved approach, virtual tensile tests are carried out. Precision is achieved more than 99% at every matching between adjacent load steps.

Original languageEnglish
Title of host publicationProceedings of the SICE Annual Conference
Pages577-584
Number of pages8
Publication statusPublished - 2010
EventSICE Annual Conference 2010, SICE 2010 - Taipei, Taiwan, Province of China
Duration: 2010 Aug 182010 Aug 21

Other

OtherSICE Annual Conference 2010, SICE 2010
CountryTaiwan, Province of China
CityTaipei
Period10/8/1810/8/21

Keywords

  • 3D-CT
  • Material evaluation
  • Nano-order observation
  • PTV

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Computer Science Applications

Cite this

Nakazawa, M., Kobayashi, M., Toda, H., & Aoki, Y. (2010). High accuracy analysis method for 3D nanoscale deformation / fracture characteristics inside a material. In Proceedings of the SICE Annual Conference (pp. 577-584). [5602327]

High accuracy analysis method for 3D nanoscale deformation / fracture characteristics inside a material. / Nakazawa, Mitsuru; Kobayashi, Masakazu; Toda, Hiroyuki; Aoki, Yoshimitsu.

Proceedings of the SICE Annual Conference. 2010. p. 577-584 5602327.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nakazawa, M, Kobayashi, M, Toda, H & Aoki, Y 2010, High accuracy analysis method for 3D nanoscale deformation / fracture characteristics inside a material. in Proceedings of the SICE Annual Conference., 5602327, pp. 577-584, SICE Annual Conference 2010, SICE 2010, Taipei, Taiwan, Province of China, 10/8/18.
Nakazawa M, Kobayashi M, Toda H, Aoki Y. High accuracy analysis method for 3D nanoscale deformation / fracture characteristics inside a material. In Proceedings of the SICE Annual Conference. 2010. p. 577-584. 5602327
Nakazawa, Mitsuru ; Kobayashi, Masakazu ; Toda, Hiroyuki ; Aoki, Yoshimitsu. / High accuracy analysis method for 3D nanoscale deformation / fracture characteristics inside a material. Proceedings of the SICE Annual Conference. 2010. pp. 577-584
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