High-contrast imaging of nano-channels using reflection near-field scanning optical microscope enhanced by optical interference

Masaru Sakai, Shuji Mononobe, Shusaku Akiba, Akifumi Matsuda, Wakana Hara, Mamoru Yoshimoto, Toshiharu Saiki

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

We demonstrated a contrast enhancement in a near-field scanning optical microscope (NSOM) by optical interference with an aperture probe in reflection (illumination-collection) mode operation. We observed a NiO film deposited on a sapphire substrate and clearly visualized 2-nm-deep nano-channel structures on the surface of the film. The reflection NSOM enhanced by optical interference is quite a promising instrument for high-resolution optical detection and estimation of low-contrast nanostructures.

Original languageEnglish
Pages (from-to)266-268
Number of pages3
JournalOptical Review
Volume13
Issue number4
DOIs
Publication statusPublished - 2006 Jul

Keywords

  • Aperture probe
  • High contrast imaging
  • High resolution imaging
  • Illumination-collection mode
  • Nano-channel
  • Near-field scanning optical microscope
  • Optical interference

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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