High-contrast imaging of nano-channels using reflection near-field scanning optical microscope enhanced by optical interference

Masaru Sakai, Shuji Mononobe, Shusaku Akiba, Akifumi Matsuda, Wakana Hara, Mamoru Yoshimoto, Toshiharu Saiki

    Research output: Contribution to journalArticle

    2 Citations (Scopus)

    Abstract

    We demonstrated a contrast enhancement in a near-field scanning optical microscope (NSOM) by optical interference with an aperture probe in reflection (illumination-collection) mode operation. We observed a NiO film deposited on a sapphire substrate and clearly visualized 2-nm-deep nano-channel structures on the surface of the film. The reflection NSOM enhanced by optical interference is quite a promising instrument for high-resolution optical detection and estimation of low-contrast nanostructures.

    Original languageEnglish
    Pages (from-to)266-268
    Number of pages3
    JournalOptical Review
    Volume13
    Issue number4
    DOIs
    Publication statusPublished - 2006 Jul 1

    Keywords

    • Aperture probe
    • High contrast imaging
    • High resolution imaging
    • Illumination-collection mode
    • Nano-channel
    • Near-field scanning optical microscope
    • Optical interference

    ASJC Scopus subject areas

    • Atomic and Molecular Physics, and Optics

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