Abstract
We demonstrated the use of a polarization near-field scanning optical microscope (NSOM) with an aperture probe in illumination-collection (internal reflection) mode operation to obtain high-contrast images of very shallow NiO nano-channels. This was accomplished by measuring the polarization change (depolarization) due to the near-field interaction between the probe aperture and the nano-channel. The polarization NSOM is a promising tool for high-resolution optical detection of nanostructures.
| Original language | English |
|---|---|
| Journal | Nanotechnology |
| Volume | 15 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 2004 Jun |
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ASJC Scopus subject areas
- Engineering (miscellaneous)
- Materials Science(all)
- Physics and Astronomy (miscellaneous)
Cite this
High-contrast imaging of NiO nano-channels using a polarization near-field scanning optical microscope. / Sakai, M.; Mononobe, S.; Sasaki, A.; Yoshimoto, M.; Saiki, Toshiharu.
In: Nanotechnology, Vol. 15, No. 6, 06.2004.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - High-contrast imaging of NiO nano-channels using a polarization near-field scanning optical microscope
AU - Sakai, M.
AU - Mononobe, S.
AU - Sasaki, A.
AU - Yoshimoto, M.
AU - Saiki, Toshiharu
PY - 2004/6
Y1 - 2004/6
N2 - We demonstrated the use of a polarization near-field scanning optical microscope (NSOM) with an aperture probe in illumination-collection (internal reflection) mode operation to obtain high-contrast images of very shallow NiO nano-channels. This was accomplished by measuring the polarization change (depolarization) due to the near-field interaction between the probe aperture and the nano-channel. The polarization NSOM is a promising tool for high-resolution optical detection of nanostructures.
AB - We demonstrated the use of a polarization near-field scanning optical microscope (NSOM) with an aperture probe in illumination-collection (internal reflection) mode operation to obtain high-contrast images of very shallow NiO nano-channels. This was accomplished by measuring the polarization change (depolarization) due to the near-field interaction between the probe aperture and the nano-channel. The polarization NSOM is a promising tool for high-resolution optical detection of nanostructures.
UR - http://www.scopus.com/inward/record.url?scp=3042599904&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=3042599904&partnerID=8YFLogxK
U2 - 10.1088/0957-4484/15/6/008
DO - 10.1088/0957-4484/15/6/008
M3 - Article
AN - SCOPUS:3042599904
VL - 15
JO - Nanotechnology
JF - Nanotechnology
SN - 0957-4484
IS - 6
ER -