Abstract
We demonstrated the use of a polarization near-field scanning optical microscope (NSOM) with an aperture probe in illumination-collection (internal reflection) mode operation to obtain high-contrast images of very shallow NiO nano-channels. This was accomplished by measuring the polarization change (depolarization) due to the near-field interaction between the probe aperture and the nano-channel. The polarization NSOM is a promising tool for high-resolution optical detection of nanostructures.
Original language | English |
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Pages (from-to) | S362-S364 |
Journal | Nanotechnology |
Volume | 15 |
Issue number | 6 |
DOIs | |
Publication status | Published - 2004 Jun |
ASJC Scopus subject areas
- Bioengineering
- Chemistry(all)
- Materials Science(all)
- Mechanics of Materials
- Mechanical Engineering
- Electrical and Electronic Engineering