High-contrast imaging of NiO nano-channels using a polarization near-field scanning optical microscope

M. Sakai, S. Mononobe, A. Sasaki, M. Yoshimoto, Toshiharu Saiki

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

We demonstrated the use of a polarization near-field scanning optical microscope (NSOM) with an aperture probe in illumination-collection (internal reflection) mode operation to obtain high-contrast images of very shallow NiO nano-channels. This was accomplished by measuring the polarization change (depolarization) due to the near-field interaction between the probe aperture and the nano-channel. The polarization NSOM is a promising tool for high-resolution optical detection of nanostructures.

Original languageEnglish
JournalNanotechnology
Volume15
Issue number6
DOIs
Publication statusPublished - 2004 Jun

Fingerprint

optical microscopes
near fields
Microscopes
Polarization
Scanning
Imaging techniques
scanning
polarization
apertures
probes
Depolarization
image contrast
depolarization
Nanostructures
Lighting
illumination
high resolution
interactions

ASJC Scopus subject areas

  • Engineering (miscellaneous)
  • Materials Science(all)
  • Physics and Astronomy (miscellaneous)

Cite this

High-contrast imaging of NiO nano-channels using a polarization near-field scanning optical microscope. / Sakai, M.; Mononobe, S.; Sasaki, A.; Yoshimoto, M.; Saiki, Toshiharu.

In: Nanotechnology, Vol. 15, No. 6, 06.2004.

Research output: Contribution to journalArticle

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