High-contrast imaging of NiO nano-channels using a polarization near-field scanning optical microscope

M. Sakai, S. Mononobe, A. Sasaki, M. Yoshimoto, T. Saiki

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    13 Citations (Scopus)

    Abstract

    We demonstrated the use of a polarization near-field scanning optical microscope (NSOM) with an aperture probe in illumination-collection (internal reflection) mode operation to obtain high-contrast images of very shallow NiO nano-channels. This was accomplished by measuring the polarization change (depolarization) due to the near-field interaction between the probe aperture and the nano-channel. The polarization NSOM is a promising tool for high-resolution optical detection of nanostructures.

    Original languageEnglish
    Pages (from-to)S362-S364
    JournalNanotechnology
    Volume15
    Issue number6
    DOIs
    Publication statusPublished - 2004 Jun 1

    ASJC Scopus subject areas

    • Bioengineering
    • Chemistry(all)
    • Materials Science(all)
    • Mechanics of Materials
    • Mechanical Engineering
    • Electrical and Electronic Engineering

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