High-contrast imaging of NiO nano-channels using a polarization near-field scanning optical microscope

M. Sakai, S. Mononobe, A. Sasaki, M. Yoshimoto, T. Saiki

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)

Abstract

We demonstrated the use of a polarization near-field scanning optical microscope (NSOM) with an aperture probe in illumination-collection (internal reflection) mode operation to obtain high-contrast images of very shallow NiO nano-channels. This was accomplished by measuring the polarization change (depolarization) due to the near-field interaction between the probe aperture and the nano-channel. The polarization NSOM is a promising tool for high-resolution optical detection of nanostructures.

Original languageEnglish
Pages (from-to)S362-S364
JournalNanotechnology
Volume15
Issue number6
DOIs
Publication statusPublished - 2004 Jun

ASJC Scopus subject areas

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering
  • Electrical and Electronic Engineering

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