High-contrast imaging of NiO nano-channels using a polarization near-field scanning optical microscope

M. Sakai; S. Mononobe; A. Sasaki; M. Yoshimoto; T. Saiki

doi:10.1088/0957-4484/15/6/008

High-contrast imaging of NiO nano-channels using a polarization near-field scanning optical microscope

M. Sakai, S. Mononobe, A. Sasaki, M. Yoshimoto, T. Saiki

Department of Electronics and Electrical Engineering

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

We demonstrated the use of a polarization near-field scanning optical microscope (NSOM) with an aperture probe in illumination-collection (internal reflection) mode operation to obtain high-contrast images of very shallow NiO nano-channels. This was accomplished by measuring the polarization change (depolarization) due to the near-field interaction between the probe aperture and the nano-channel. The polarization NSOM is a promising tool for high-resolution optical detection of nanostructures.

Original language	English
Pages (from-to)	S362-S364
Journal	Nanotechnology
Volume	15
Issue number	6
DOIs	https://doi.org/10.1088/0957-4484/15/6/008
Publication status	Published - 2004 Jun

ASJC Scopus subject areas

Bioengineering
Chemistry(all)
Materials Science(all)
Mechanics of Materials
Mechanical Engineering
Electrical and Electronic Engineering

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10.1088/0957-4484/15/6/008

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@article{667abe01d6cd4cf0bc906d53aaf0dc8c,

title = "High-contrast imaging of NiO nano-channels using a polarization near-field scanning optical microscope",

abstract = "We demonstrated the use of a polarization near-field scanning optical microscope (NSOM) with an aperture probe in illumination-collection (internal reflection) mode operation to obtain high-contrast images of very shallow NiO nano-channels. This was accomplished by measuring the polarization change (depolarization) due to the near-field interaction between the probe aperture and the nano-channel. The polarization NSOM is a promising tool for high-resolution optical detection of nanostructures.",

author = "M. Sakai and S. Mononobe and A. Sasaki and M. Yoshimoto and T. Saiki",

year = "2004",

month = jun,

doi = "10.1088/0957-4484/15/6/008",

language = "English",

volume = "15",

pages = "S362--S364",

journal = "Nanotechnology",

issn = "0957-4484",

publisher = "IOP Publishing Ltd.",

number = "6",

}

TY - JOUR

T1 - High-contrast imaging of NiO nano-channels using a polarization near-field scanning optical microscope

AU - Sakai, M.

AU - Mononobe, S.

AU - Sasaki, A.

AU - Yoshimoto, M.

AU - Saiki, T.

PY - 2004/6

Y1 - 2004/6

N2 - We demonstrated the use of a polarization near-field scanning optical microscope (NSOM) with an aperture probe in illumination-collection (internal reflection) mode operation to obtain high-contrast images of very shallow NiO nano-channels. This was accomplished by measuring the polarization change (depolarization) due to the near-field interaction between the probe aperture and the nano-channel. The polarization NSOM is a promising tool for high-resolution optical detection of nanostructures.

AB - We demonstrated the use of a polarization near-field scanning optical microscope (NSOM) with an aperture probe in illumination-collection (internal reflection) mode operation to obtain high-contrast images of very shallow NiO nano-channels. This was accomplished by measuring the polarization change (depolarization) due to the near-field interaction between the probe aperture and the nano-channel. The polarization NSOM is a promising tool for high-resolution optical detection of nanostructures.

UR - http://www.scopus.com/inward/record.url?scp=3042599904&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=3042599904&partnerID=8YFLogxK

U2 - 10.1088/0957-4484/15/6/008

DO - 10.1088/0957-4484/15/6/008

M3 - Article

AN - SCOPUS:3042599904

VL - 15

SP - S362-S364

JO - Nanotechnology

JF - Nanotechnology

SN - 0957-4484

IS - 6

ER -

High-contrast imaging of NiO nano-channels using a polarization near-field scanning optical microscope

Abstract

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