High-pressure induced structural changes in metastable Ge 2Sb2Te5 thin films: An X-ray absorption study

P. Fons, A. V. Kolobov, J. Tominaga, Y. Katayama

Research output: Contribution to journalConference articlepeer-review

5 Citations (Scopus)

Abstract

Super-resolution (SR) media offer up to a factor of ten increase in areal storage density over conventional DVD media. Although SR has been realized, there is a strong need for a deeper understanding of structural and electronic changes in Ge2Sb2Te5 (GST), a principal optical memory component, with external perturbations. Recording of SR disks leads to the formation of gas-phase bubbles that in turn lead to the development of large stresses on the underlying GST layer. In this paper we report on XAFS of nominally hydrostatic (0-10 GPa) compressive stress-induced structural changes of the metastable crystalline phase of GST. An analysis showed that the initial splitting of Ge-Te bond lengths of the room-temperature distorted rocksalt structure decreased to a small but finite splitting for p ≳ 6 GPa. The implications of this upon the proposed ferroelectric catastrophe super-RENS readout mechanism are discussed.

Original languageEnglish
Pages (from-to)160-162
Number of pages3
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume238
Issue number1-4
DOIs
Publication statusPublished - 2005 Aug 1
Externally publishedYes
EventSynchrotron Radiation in Materials Science Proceedings of the 4th Conference on Synchrotron Radiation in Materials Science -
Duration: 2004 Aug 232004 Aug 25

Keywords

  • Ge-Sb-Te
  • High-pressure
  • Optical memory
  • Structure
  • XAFS

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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