High resolution electron microscopy observation of TiC coated cemented carbide

Tetsuya Suzuki, Masaru Yagi, Kunio Shibuki, Toshiyuki Suzuki, Yuichi Ikuhara

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Cemented carbide (WC-6%Co) inserts were coated with 3-4 μm TiC by chemical vapor deposition at 1200 °C. High resolution electron microscopic observation showed the presence of Co6W6C (n1-phase) around the interface WC-Co, on top of which a TiC film 50-100 nm in size was observed. There was no particular crystallographic orientation relationship between the n1-phase and TiC films. The presence of W atoms in the films was confirmed using EDX by focusing an electron beam of size approximately 5 nm. In addition, the Σ = 2 boundary, which was attributed to the identical c/a ratio of WC, was observed between WC-WC grains.

Original languageEnglish
Pages (from-to)268-275
Number of pages8
JournalSurface and Coatings Technology
Volume79
Issue number1-3
DOIs
Publication statusPublished - 1996 Feb
Externally publishedYes

Keywords

  • Cemented carbide
  • High resolution electron microscopy
  • Interface
  • TiC film
  • η-phase

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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