High resolution electron microscopy observation of TiC coated cemented carbide

Tetsuya Suzuki; Masaru Yagi; Kunio Shibuki; Toshiyuki Suzuki; Yuichi Ikuhara

doi:10.1016/0257-8972(95)02464-6

High resolution electron microscopy observation of TiC coated cemented carbide

Tetsuya Suzuki, Masaru Yagi, Kunio Shibuki, Toshiyuki Suzuki, Yuichi Ikuhara

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

Cemented carbide (WC-6%Co) inserts were coated with 3-4 μm TiC by chemical vapor deposition at 1200 °C. High resolution electron microscopic observation showed the presence of Co₆W₆C (n₁-phase) around the interface WC-Co, on top of which a TiC film 50-100 nm in size was observed. There was no particular crystallographic orientation relationship between the n₁-phase and TiC films. The presence of W atoms in the films was confirmed using EDX by focusing an electron beam of size approximately 5 nm. In addition, the Σ = 2 boundary, which was attributed to the identical c/a ratio of WC, was observed between WC-WC grains.

Original language	English
Pages (from-to)	268-275
Number of pages	8
Journal	Surface and Coatings Technology
Volume	79
Issue number	1-3
DOIs	https://doi.org/10.1016/0257-8972(95)02464-6
Publication status	Published - 1996 Feb
Externally published	Yes

Keywords

Cemented carbide
High resolution electron microscopy
Interface
TiC film
η-phase

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/0257-8972(95)02464-6

Cite this

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title = "High resolution electron microscopy observation of TiC coated cemented carbide",

abstract = "Cemented carbide (WC-6%Co) inserts were coated with 3-4 μm TiC by chemical vapor deposition at 1200 °C. High resolution electron microscopic observation showed the presence of Co6W6C (n1-phase) around the interface WC-Co, on top of which a TiC film 50-100 nm in size was observed. There was no particular crystallographic orientation relationship between the n1-phase and TiC films. The presence of W atoms in the films was confirmed using EDX by focusing an electron beam of size approximately 5 nm. In addition, the Σ = 2 boundary, which was attributed to the identical c/a ratio of WC, was observed between WC-WC grains.",

keywords = "Cemented carbide, High resolution electron microscopy, Interface, TiC film, η-phase",

author = "Tetsuya Suzuki and Masaru Yagi and Kunio Shibuki and Toshiyuki Suzuki and Yuichi Ikuhara",

year = "1996",

month = feb,

doi = "10.1016/0257-8972(95)02464-6",

language = "English",

volume = "79",

pages = "268--275",

journal = "Surface and Coatings Technology",

issn = "0257-8972",

publisher = "Elsevier",

number = "1-3",

}

TY - JOUR

T1 - High resolution electron microscopy observation of TiC coated cemented carbide

AU - Suzuki, Tetsuya

AU - Yagi, Masaru

AU - Shibuki, Kunio

AU - Suzuki, Toshiyuki

AU - Ikuhara, Yuichi

PY - 1996/2

Y1 - 1996/2

N2 - Cemented carbide (WC-6%Co) inserts were coated with 3-4 μm TiC by chemical vapor deposition at 1200 °C. High resolution electron microscopic observation showed the presence of Co6W6C (n1-phase) around the interface WC-Co, on top of which a TiC film 50-100 nm in size was observed. There was no particular crystallographic orientation relationship between the n1-phase and TiC films. The presence of W atoms in the films was confirmed using EDX by focusing an electron beam of size approximately 5 nm. In addition, the Σ = 2 boundary, which was attributed to the identical c/a ratio of WC, was observed between WC-WC grains.

AB - Cemented carbide (WC-6%Co) inserts were coated with 3-4 μm TiC by chemical vapor deposition at 1200 °C. High resolution electron microscopic observation showed the presence of Co6W6C (n1-phase) around the interface WC-Co, on top of which a TiC film 50-100 nm in size was observed. There was no particular crystallographic orientation relationship between the n1-phase and TiC films. The presence of W atoms in the films was confirmed using EDX by focusing an electron beam of size approximately 5 nm. In addition, the Σ = 2 boundary, which was attributed to the identical c/a ratio of WC, was observed between WC-WC grains.

KW - Cemented carbide

KW - High resolution electron microscopy

KW - Interface

KW - TiC film

KW - η-phase

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U2 - 10.1016/0257-8972(95)02464-6

DO - 10.1016/0257-8972(95)02464-6

M3 - Article

AN - SCOPUS:0030083671

SN - 0257-8972

VL - 79

SP - 268

EP - 275

JO - Surface and Coatings Technology

JF - Surface and Coatings Technology

IS - 1-3

ER -

High resolution electron microscopy observation of TiC coated cemented carbide

Abstract

Keywords

ASJC Scopus subject areas

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