High resolution electron microscopy observation of TiC coated cemented carbide

Tetsuya Suzuki, Masaru Yagi, Kunio Shibuki, Toshiyuki Suzuki, Yuichi Ikuhara

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Cemented carbide (WC-6%Co) inserts were coated with 3-4 μm TiC by chemical vapor deposition at 1200 °C. High resolution electron microscopic observation showed the presence of Co6W6C (n1-phase) around the interface WC-Co, on top of which a TiC film 50-100 nm in size was observed. There was no particular crystallographic orientation relationship between the n1-phase and TiC films. The presence of W atoms in the films was confirmed using EDX by focusing an electron beam of size approximately 5 nm. In addition, the Σ = 2 boundary, which was attributed to the identical c/a ratio of WC, was observed between WC-WC grains.

Original languageEnglish
Pages (from-to)268-275
Number of pages8
JournalSurface and Coatings Technology
Volume79
Issue number1-3
Publication statusPublished - 1996 Feb
Externally publishedYes

Fingerprint

High resolution electron microscopy
carbides
Carbides
electron microscopy
high resolution
inserts
Energy dispersive spectroscopy
Chemical vapor deposition
Electron beams
vapor deposition
electron beams
Atoms
Electrons
atoms
electrons

Keywords

  • η-phase
  • Cemented carbide
  • High resolution electron microscopy
  • Interface
  • TiC film

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Suzuki, T., Yagi, M., Shibuki, K., Suzuki, T., & Ikuhara, Y. (1996). High resolution electron microscopy observation of TiC coated cemented carbide. Surface and Coatings Technology, 79(1-3), 268-275.

High resolution electron microscopy observation of TiC coated cemented carbide. / Suzuki, Tetsuya; Yagi, Masaru; Shibuki, Kunio; Suzuki, Toshiyuki; Ikuhara, Yuichi.

In: Surface and Coatings Technology, Vol. 79, No. 1-3, 02.1996, p. 268-275.

Research output: Contribution to journalArticle

Suzuki, T, Yagi, M, Shibuki, K, Suzuki, T & Ikuhara, Y 1996, 'High resolution electron microscopy observation of TiC coated cemented carbide', Surface and Coatings Technology, vol. 79, no. 1-3, pp. 268-275.
Suzuki, Tetsuya ; Yagi, Masaru ; Shibuki, Kunio ; Suzuki, Toshiyuki ; Ikuhara, Yuichi. / High resolution electron microscopy observation of TiC coated cemented carbide. In: Surface and Coatings Technology. 1996 ; Vol. 79, No. 1-3. pp. 268-275.
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