High-resolution examination of recording marks in phase-change media using a scanning near-field optical microscope

Toshiyasu Tadokoro, Toshiharu Saiki, Keiichiro Yusu, Katsutaro Ichihara

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

Recording marks in digital versatile disc-random access memory (DVD-RAM) were examined using a scanning near-field optical microscope (SNOM) incorporating an improved probe tip design. The marks were recorded on an experimental DVD-RAM medium with a track-pitch of 0.6 μm. The tip size of the SNOM was made wider than the track width in order to avoid optical ghosting arising from the track edge. The recording power was varied in order to investigate the dependence of the mark shape on power and it was found that the mark shape correlated well with the reproduced signal. The SNOM is considered to be a good candidate for a practical characterization tool for optical recording media.

Original languageEnglish
Pages (from-to)3599-3602
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume39
Issue number6 A
Publication statusPublished - 2000
Externally publishedYes

Fingerprint

optical microscopes
near fields
Microscopes
examination
recording
random access memory
Scanning
scanning
high resolution
Optical recording
Data storage equipment
probes

Keywords

  • Carrier-to-noise ratio
  • DVD-RAM
  • Phase-change
  • Probe tip
  • Recording mark
  • Scanning near-field optical microscope

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

High-resolution examination of recording marks in phase-change media using a scanning near-field optical microscope. / Tadokoro, Toshiyasu; Saiki, Toshiharu; Yusu, Keiichiro; Ichihara, Katsutaro.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 39, No. 6 A, 2000, p. 3599-3602.

Research output: Contribution to journalArticle

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