Abstract
The uniformity of site-controlled, pyramidal InGaAs/AlGaAs semiconductor quantum dots (QD) grown by chemical vapor deposition (CVD) on prepatterned substrates was analyzed. The pyramidal QD were fabricated by low pressure organometallic CVD on a (111)B-oriented GaAs substrate patterned with a 5 μm pitch hexagonal matrix of tetrahedral recesses. It was found that the observed inhomogeneous broadening of about 7.6 meV for a s-p separation energy of at least 55 meV is small compared to other QD systems. A high reproducibility of the sharp QD emission features in the single exciton regime was observed.
Original language | English |
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Pages (from-to) | 1943-1945 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 84 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2004 Mar 15 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)