Homogeneous linewidth study of a single In0.5Ga0.5As quantum dot at high temperature by using near-field scanning optical microscope

Kazunari Matsuda, Toshiharu Saiki, Hideaki Tsuchiya, Hideaki Saito, Kenichi Nishi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The photoluminescence spectroscopy of single quantum dots at room temperature was performed with a near-field scanning optical microscope. We measured temperature dependence of PL linewidth and discussed the mechanism of its broadening.

Original languageEnglish
Title of host publicationQuantum Electronics and Laser Science Conference, QELS 2000
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)9781557528209
Publication statusPublished - 2000
Externally publishedYes
EventQuantum Electronics and Laser Science Conference, QELS 2000 - San Francisco, United States
Duration: 2000 May 72000 May 11

Publication series

NameOptics InfoBase Conference Papers

Conference

ConferenceQuantum Electronics and Laser Science Conference, QELS 2000
Country/TerritoryUnited States
CitySan Francisco
Period00/5/700/5/11

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

Fingerprint

Dive into the research topics of 'Homogeneous linewidth study of a single In0.5Ga0.5As quantum dot at high temperature by using near-field scanning optical microscope'. Together they form a unique fingerprint.

Cite this