ICA-based positive semidefinite matrix templates for eye-blink artifact removal from EEG signal with single-electrode

Suguru Kanoga, Yasue Mitsukura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Complete artifact removal of eye-blink for electroencephalographic (EEG) signal is generally-regarded as important process in EEG signal analysis. No numerical approach of eye-blink artifact removal for single-channel EEG signal in time domain is developed. In this paper, we propose a time domain eye-blink artifact removal method for single-channel EEG signal using independent component analysis (ICA)-based templates. ICA and positive semidefinite tensor factorization (PSDTF) are employed in our proposed method. As a result, we obtain high signal-to-noise ratio (15.03dB) and low mean square error (25.76). Moreover, the optimal number of iterations on multiplicative update rules in PSDTF is about 20 to 30. A useful time domain eye-blink artifact removal method for single-channel EEG signal was proposed by using ICA-based PSD matrix templates. Improvement of eye-blink artifact removal accuracy and reduction of computational cost are our main future works.

Original languageEnglish
Title of host publication2015 10th Asian Control Conference: Emerging Control Techniques for a Sustainable World, ASCC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479978625
DOIs
Publication statusPublished - 2015 Sep 8
Event10th Asian Control Conference, ASCC 2015 - Kota Kinabalu, Malaysia
Duration: 2015 May 312015 Jun 3

Other

Other10th Asian Control Conference, ASCC 2015
CountryMalaysia
CityKota Kinabalu
Period15/5/3115/6/3

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ASJC Scopus subject areas

  • Control and Systems Engineering

Cite this

Kanoga, S., & Mitsukura, Y. (2015). ICA-based positive semidefinite matrix templates for eye-blink artifact removal from EEG signal with single-electrode. In 2015 10th Asian Control Conference: Emerging Control Techniques for a Sustainable World, ASCC 2015 [7244386] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ASCC.2015.7244386