Image quality improvement for low dose exposure in the sparse X-ray CT scanner

Takashi Kobayashi, Toshiyuki Tanaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In X-ray CT, medical X-ray exposure is the key issue for patients. Recently, low dose exposure is demanded in the industrial X-ray CT. But the dose of X-ray and the image quality are directly correlated. Therefore, research objective is to get high quality images trying to minimize X-ray exposure. Specifically, we reduce the number of X-ray views. We supplied data by using linear interpolation. As a result, we were able to eliminate conspicuous line noise to occur by having reduced the number of views. But different noises extending to horizontal rotatory direction occurred in the method.

Original languageEnglish
Title of host publication2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages41-44
Number of pages4
ISBN (Print)9784907764487
DOIs
Publication statusPublished - 2015 Sep 30
Event54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015 - Hangzhou, China
Duration: 2015 Jul 282015 Jul 30

Other

Other54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015
CountryChina
CityHangzhou
Period15/7/2815/7/30

Fingerprint

Image quality
Dosimetry
X rays
Interpolation

Keywords

  • Linear interpolation
  • Low dose exposure
  • The number of views
  • X-ray CT

ASJC Scopus subject areas

  • Control and Systems Engineering

Cite this

Kobayashi, T., & Tanaka, T. (2015). Image quality improvement for low dose exposure in the sparse X-ray CT scanner. In 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015 (pp. 41-44). [7285467] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SICE.2015.7285467

Image quality improvement for low dose exposure in the sparse X-ray CT scanner. / Kobayashi, Takashi; Tanaka, Toshiyuki.

2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 41-44 7285467.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kobayashi, T & Tanaka, T 2015, Image quality improvement for low dose exposure in the sparse X-ray CT scanner. in 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015., 7285467, Institute of Electrical and Electronics Engineers Inc., pp. 41-44, 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015, Hangzhou, China, 15/7/28. https://doi.org/10.1109/SICE.2015.7285467
Kobayashi T, Tanaka T. Image quality improvement for low dose exposure in the sparse X-ray CT scanner. In 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 41-44. 7285467 https://doi.org/10.1109/SICE.2015.7285467
Kobayashi, Takashi ; Tanaka, Toshiyuki. / Image quality improvement for low dose exposure in the sparse X-ray CT scanner. 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 41-44
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