@article{6f1dd4e8ac6947e2bfe634a0b39091a7,
title = "Imaging Technique of Very Small Change Using Two-dimensional Lock-in Amplifier Systems",
keywords = "charge distribution, lock-in amplifier, microscopic imaging, nondestructive test, stress measurement, thermal image",
author = "Takashi Maeno",
year = "1996",
doi = "10.2493/jjspe.62.649",
language = "English",
volume = "62",
pages = "649--652",
journal = "Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering",
issn = "0912-0289",
publisher = "Japan Society for Precision Engineering",
number = "5",
}