Imaging Technique of Very Small Change Using Two-dimensional Lock-in Amplifier Systems

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)649-652
Number of pages4
JournalSeimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering
Volume62
Issue number5
DOIs
Publication statusPublished - 1996
Externally publishedYes

Keywords

  • charge distribution
  • lock-in amplifier
  • microscopic imaging
  • nondestructive test
  • stress measurement
  • thermal image

ASJC Scopus subject areas

  • Mechanical Engineering

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