Imaging Three-Dimensional Surface Objects with Submolecular Resolution by Atomic Force Microscopy

César Moreno, Oleksandr Stetsovych, Tomoko Shimizu, Oscar Custance

Research output: Contribution to journalArticle

39 Citations (Scopus)

Abstract

Submolecular imaging by atomic force microscopy (AFM) has recently been established as a stunning technique to reveal the chemical structure of unknown molecules, to characterize intramolecular charge distributions and bond ordering, as well as to study chemical transformations and intermolecular interactions. So far, most of these feats were achieved on planar molecular systems because high-resolution imaging of three-dimensional (3D) surface structures with AFM remains challenging. Here we present a method for high-resolution imaging of nonplanar molecules and 3D surface systems using AFM with silicon cantilevers as force sensors. We demonstrate this method by resolving the step-edges of the (101) anatase surface at the atomic scale by simultaneously visualizing the structure of a pentacene molecule together with the atomic positions of the substrate and by resolving the contour and probe-surface force field on a C60 molecule with intramolecular resolution. The method reported here holds substantial promise for the study of 3D surface systems such as nanotubes, clusters, nanoparticles, polymers, and biomolecules using AFM with high resolution. (Figure Presented).

Original languageEnglish
Pages (from-to)2257-2262
Number of pages6
JournalNano Letters
Volume15
Issue number4
DOIs
Publication statusPublished - 2015 Apr 8
Externally publishedYes

Fingerprint

Atomic force microscopy
atomic force microscopy
Imaging techniques
Molecules
molecules
high resolution
Charge distribution
Biomolecules
Silicon
Surface structure
Titanium dioxide
Nanotubes
Polymers
anatase
charge distribution
field theory (physics)
Nanoparticles
nanotubes
Sensors
Substrates

Keywords

  • High-resolution imaging
  • Noncontact atomic force microscopy (NC-AFM)
  • Submolecular resolution
  • Three-dimensional dynamic force spectroscopy

ASJC Scopus subject areas

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering

Cite this

Imaging Three-Dimensional Surface Objects with Submolecular Resolution by Atomic Force Microscopy. / Moreno, César; Stetsovych, Oleksandr; Shimizu, Tomoko; Custance, Oscar.

In: Nano Letters, Vol. 15, No. 4, 08.04.2015, p. 2257-2262.

Research output: Contribution to journalArticle

Moreno, César ; Stetsovych, Oleksandr ; Shimizu, Tomoko ; Custance, Oscar. / Imaging Three-Dimensional Surface Objects with Submolecular Resolution by Atomic Force Microscopy. In: Nano Letters. 2015 ; Vol. 15, No. 4. pp. 2257-2262.
@article{accd3280072c429a8424c4ed68f6d2ce,
title = "Imaging Three-Dimensional Surface Objects with Submolecular Resolution by Atomic Force Microscopy",
abstract = "Submolecular imaging by atomic force microscopy (AFM) has recently been established as a stunning technique to reveal the chemical structure of unknown molecules, to characterize intramolecular charge distributions and bond ordering, as well as to study chemical transformations and intermolecular interactions. So far, most of these feats were achieved on planar molecular systems because high-resolution imaging of three-dimensional (3D) surface structures with AFM remains challenging. Here we present a method for high-resolution imaging of nonplanar molecules and 3D surface systems using AFM with silicon cantilevers as force sensors. We demonstrate this method by resolving the step-edges of the (101) anatase surface at the atomic scale by simultaneously visualizing the structure of a pentacene molecule together with the atomic positions of the substrate and by resolving the contour and probe-surface force field on a C60 molecule with intramolecular resolution. The method reported here holds substantial promise for the study of 3D surface systems such as nanotubes, clusters, nanoparticles, polymers, and biomolecules using AFM with high resolution. (Figure Presented).",
keywords = "High-resolution imaging, Noncontact atomic force microscopy (NC-AFM), Submolecular resolution, Three-dimensional dynamic force spectroscopy",
author = "C{\'e}sar Moreno and Oleksandr Stetsovych and Tomoko Shimizu and Oscar Custance",
year = "2015",
month = "4",
day = "8",
doi = "10.1021/nl504182w",
language = "English",
volume = "15",
pages = "2257--2262",
journal = "Nano Letters",
issn = "1530-6984",
publisher = "American Chemical Society",
number = "4",

}

TY - JOUR

T1 - Imaging Three-Dimensional Surface Objects with Submolecular Resolution by Atomic Force Microscopy

AU - Moreno, César

AU - Stetsovych, Oleksandr

AU - Shimizu, Tomoko

AU - Custance, Oscar

PY - 2015/4/8

Y1 - 2015/4/8

N2 - Submolecular imaging by atomic force microscopy (AFM) has recently been established as a stunning technique to reveal the chemical structure of unknown molecules, to characterize intramolecular charge distributions and bond ordering, as well as to study chemical transformations and intermolecular interactions. So far, most of these feats were achieved on planar molecular systems because high-resolution imaging of three-dimensional (3D) surface structures with AFM remains challenging. Here we present a method for high-resolution imaging of nonplanar molecules and 3D surface systems using AFM with silicon cantilevers as force sensors. We demonstrate this method by resolving the step-edges of the (101) anatase surface at the atomic scale by simultaneously visualizing the structure of a pentacene molecule together with the atomic positions of the substrate and by resolving the contour and probe-surface force field on a C60 molecule with intramolecular resolution. The method reported here holds substantial promise for the study of 3D surface systems such as nanotubes, clusters, nanoparticles, polymers, and biomolecules using AFM with high resolution. (Figure Presented).

AB - Submolecular imaging by atomic force microscopy (AFM) has recently been established as a stunning technique to reveal the chemical structure of unknown molecules, to characterize intramolecular charge distributions and bond ordering, as well as to study chemical transformations and intermolecular interactions. So far, most of these feats were achieved on planar molecular systems because high-resolution imaging of three-dimensional (3D) surface structures with AFM remains challenging. Here we present a method for high-resolution imaging of nonplanar molecules and 3D surface systems using AFM with silicon cantilevers as force sensors. We demonstrate this method by resolving the step-edges of the (101) anatase surface at the atomic scale by simultaneously visualizing the structure of a pentacene molecule together with the atomic positions of the substrate and by resolving the contour and probe-surface force field on a C60 molecule with intramolecular resolution. The method reported here holds substantial promise for the study of 3D surface systems such as nanotubes, clusters, nanoparticles, polymers, and biomolecules using AFM with high resolution. (Figure Presented).

KW - High-resolution imaging

KW - Noncontact atomic force microscopy (NC-AFM)

KW - Submolecular resolution

KW - Three-dimensional dynamic force spectroscopy

UR - http://www.scopus.com/inward/record.url?scp=84926611569&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84926611569&partnerID=8YFLogxK

U2 - 10.1021/nl504182w

DO - 10.1021/nl504182w

M3 - Article

C2 - 25756297

AN - SCOPUS:84926611569

VL - 15

SP - 2257

EP - 2262

JO - Nano Letters

JF - Nano Letters

SN - 1530-6984

IS - 4

ER -