Improvement of near-infrared topography by optode arrangement and reconstruction algorithm using spatial sensitivity profile

Hiroshi Kawaguchi, Toshiyuki Hayashi, Toshinori Kato, Eiji Okada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Near-infrared topographic imaging can noninvasively measure the distribution of brain activation in the cortex. The near-infrared light is strongly scattered in the superficial tissues and the volume of tissue sampled by a source-detector pair of the imaging system is broadly distributed in the cortical tissue. This poses results in poor spatial resolution and contrast in the topographic images. In this study, we propose reconstruction algorithm for near- infrared topographic imaging using the spatial sensitivity profile. The profile of absorption change in the head model is calculated to evaluate the proposed algorithm. The width of the profiles calculated by the proposed algorithm is smaller than that by the conventional mapping algorithm. The profiles calculated by the proposed algorithm agree with the correct distribution when the interval of the source-detector pairs is less than 8 mm.

Original languageEnglish
Title of host publicationAPBME 2003 - IEEE EMBS Asian-Pacific Conference on Biomedical Engineering 2003
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages314-315
Number of pages2
ISBN (Print)0780379438, 9780780379435
DOIs
Publication statusPublished - 2003
EventIEEE EMBS Asian-Pacific Conference on Biomedical Engineering 2003, APBME 2003 - Kyoto-Osaka-Nara, Japan
Duration: 2003 Oct 202003 Oct 22

Other

OtherIEEE EMBS Asian-Pacific Conference on Biomedical Engineering 2003, APBME 2003
CountryJapan
CityKyoto-Osaka-Nara
Period03/10/2003/10/22

Fingerprint

Topography
Infrared radiation
Infrared imaging
Tissue
Detectors
Imaging systems
Brain
Chemical activation

Keywords

  • Image reconstruction technique
  • Medical and biological imaging
  • Near infrared spectroscopy

ASJC Scopus subject areas

  • Biomedical Engineering

Cite this

Kawaguchi, H., Hayashi, T., Kato, T., & Okada, E. (2003). Improvement of near-infrared topography by optode arrangement and reconstruction algorithm using spatial sensitivity profile. In APBME 2003 - IEEE EMBS Asian-Pacific Conference on Biomedical Engineering 2003 (pp. 314-315). [1302710] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APBME.2003.1302710

Improvement of near-infrared topography by optode arrangement and reconstruction algorithm using spatial sensitivity profile. / Kawaguchi, Hiroshi; Hayashi, Toshiyuki; Kato, Toshinori; Okada, Eiji.

APBME 2003 - IEEE EMBS Asian-Pacific Conference on Biomedical Engineering 2003. Institute of Electrical and Electronics Engineers Inc., 2003. p. 314-315 1302710.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kawaguchi, H, Hayashi, T, Kato, T & Okada, E 2003, Improvement of near-infrared topography by optode arrangement and reconstruction algorithm using spatial sensitivity profile. in APBME 2003 - IEEE EMBS Asian-Pacific Conference on Biomedical Engineering 2003., 1302710, Institute of Electrical and Electronics Engineers Inc., pp. 314-315, IEEE EMBS Asian-Pacific Conference on Biomedical Engineering 2003, APBME 2003, Kyoto-Osaka-Nara, Japan, 03/10/20. https://doi.org/10.1109/APBME.2003.1302710
Kawaguchi H, Hayashi T, Kato T, Okada E. Improvement of near-infrared topography by optode arrangement and reconstruction algorithm using spatial sensitivity profile. In APBME 2003 - IEEE EMBS Asian-Pacific Conference on Biomedical Engineering 2003. Institute of Electrical and Electronics Engineers Inc. 2003. p. 314-315. 1302710 https://doi.org/10.1109/APBME.2003.1302710
Kawaguchi, Hiroshi ; Hayashi, Toshiyuki ; Kato, Toshinori ; Okada, Eiji. / Improvement of near-infrared topography by optode arrangement and reconstruction algorithm using spatial sensitivity profile. APBME 2003 - IEEE EMBS Asian-Pacific Conference on Biomedical Engineering 2003. Institute of Electrical and Electronics Engineers Inc., 2003. pp. 314-315
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