Improvement of operationality for bilateral control based on nominal mass design in disturbance observer

Tomoyuki Shimono, Seiichiro Katsura, Kouhei Ohnishi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Abstract

In recent years, although there are many researches on bilateral control, there is little research on improvement of operationality. It will be so effective for operators to improve the operationality of the system in bilateral control. In this paper, a new improving method of operationality which is based on design of nominal mass in disturbance observer is proposed. First, disturbance observer which is implemented in the system is introduced. Then, the relationship between observer gain and nominal mass variation in disturbance observer is discussed. Secondly, bilateral control for transmitting of vivid force sensation is proposed. Then, the proposed method is applied to bilateral control. Finally, the experimental results show the viability of the proposed method.

Original languageEnglish
Title of host publicationIECON 2005
Subtitle of host publication31st Annual Conference of IEEE Industrial Electronics Society
Pages2035-2040
Number of pages6
DOIs
Publication statusPublished - 2005 Dec 1
EventIECON 2005: 31st Annual Conference of IEEE Industrial Electronics Society - Raleigh, NC, United States
Duration: 2005 Nov 62005 Nov 10

Publication series

NameIECON Proceedings (Industrial Electronics Conference)
Volume2005

Other

OtherIECON 2005: 31st Annual Conference of IEEE Industrial Electronics Society
CountryUnited States
CityRaleigh, NC
Period05/11/605/11/10

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Cite this

Shimono, T., Katsura, S., & Ohnishi, K. (2005). Improvement of operationality for bilateral control based on nominal mass design in disturbance observer. In IECON 2005: 31st Annual Conference of IEEE Industrial Electronics Society (pp. 2035-2040). [1569217] (IECON Proceedings (Industrial Electronics Conference); Vol. 2005). https://doi.org/10.1109/IECON.2005.1569217