In situ AP-XPS analysis of a Pt thin-film sensor for highly sensitive H2detection

Ryo Toyoshima, Takahisa Tanaka, Taro Kato, Ken Uchida, Hiroshi Kondoh

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

In situ ambient-pressure X-ray photoelectron spectroscopy (AP-XPS) combined with resistivity measurement was performed for a Pt thin-film H2 gas sensor. We experimentally demonstrate that the chemical state of the Pt surface changes under working conditions, and it directly links to the sensing performance. Moreover, the operating principle is discussed at the atomic scale. This journal is

Original languageEnglish
Pages (from-to)10147-10150
Number of pages4
JournalChemical Communications
Volume56
Issue number70
DOIs
Publication statusPublished - 2020 Sep 11

ASJC Scopus subject areas

  • Catalysis
  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Chemistry(all)
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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