In-situ measurement of molecular orientation of the pentacene ultrathin films grown on SiO2 substrates

Genki Yoshikawa; Tetsuhiko Miyadera; Ryo Onoki; Keiji Ueno; Ikuyo Nakai; Shiro Entani; Susumu Ikeda; Dong Guo; Manabu Kiguchi; Hiroshi Kondoh; Toshiaki Ohta; Koichiro Saiki

doi:10.1016/j.susc.2006.04.012

In-situ measurement of molecular orientation of the pentacene ultrathin films grown on SiO₂ substrates

Genki Yoshikawa, Tetsuhiko Miyadera, Ryo Onoki, Keiji Ueno, Ikuyo Nakai, Shiro Entani, Susumu Ikeda, Dong Guo, Manabu Kiguchi, Hiroshi Kondoh, Toshiaki Ohta, Koichiro Saiki

Research output: Contribution to journal › Article › peer-review

26 Citations (Scopus)

Abstract

Molecular orientations of pentacene ultrathin films grown on SiO₂ substrates were studied without the influence of the atmosphere by vacuum atomic force microscopy (V-AFM) and near edge X-ray absorption fine structure (NEXAFS). The experimental processes from deposition of pentacene to characterization of films were performed under vacuum condition without exposure to the atmosphere. V-AFM and NEXAFS measurements showed that pentacene molecules tend to grow on SiO₂ surface with their molecular long axes perpendicular to the substrate surfaces (standing-mode) irrespective of preparation procedure of SiO₂ substrate.

Original language	English
Pages (from-to)	2518-2522
Number of pages	5
Journal	Surface Science
Volume	600
Issue number	12
DOIs	https://doi.org/10.1016/j.susc.2006.04.012
Publication status	Published - 2006 Jun 15
Externally published	Yes

Keywords

Aromatics
Atomic force microscopy
In-situ characterization
Near edge extended X-ray absorption fine structure (NEXAFS)
Pentacene
Silicon oxides
Surface structure, morphology, roughness and topography
Thin film structures

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

Access to Document

10.1016/j.susc.2006.04.012

Cite this

@article{668b8571e92741cca0f4a58cfbcfa016,

title = "In-situ measurement of molecular orientation of the pentacene ultrathin films grown on SiO2 substrates",

abstract = "Molecular orientations of pentacene ultrathin films grown on SiO2 substrates were studied without the influence of the atmosphere by vacuum atomic force microscopy (V-AFM) and near edge X-ray absorption fine structure (NEXAFS). The experimental processes from deposition of pentacene to characterization of films were performed under vacuum condition without exposure to the atmosphere. V-AFM and NEXAFS measurements showed that pentacene molecules tend to grow on SiO2 surface with their molecular long axes perpendicular to the substrate surfaces (standing-mode) irrespective of preparation procedure of SiO2 substrate.",

keywords = "Aromatics, Atomic force microscopy, In-situ characterization, Near edge extended X-ray absorption fine structure (NEXAFS), Pentacene, Silicon oxides, Surface structure, morphology, roughness and topography, Thin film structures",

author = "Genki Yoshikawa and Tetsuhiko Miyadera and Ryo Onoki and Keiji Ueno and Ikuyo Nakai and Shiro Entani and Susumu Ikeda and Dong Guo and Manabu Kiguchi and Hiroshi Kondoh and Toshiaki Ohta and Koichiro Saiki",

note = "Funding Information: This work was supported by Grant-in-Aid for Creative Scientific Research (14GS0207) and for The 21st Century COE Program for Frontiers in Fundamental Chemistry from the Ministry of Education, Culture, Sports, Science and Technology. This research was performed under the approval of the Photon Factory Program Advisory Committee (proposal No. 2003G259).",

year = "2006",

month = jun,

day = "15",

doi = "10.1016/j.susc.2006.04.012",

language = "English",

volume = "600",

pages = "2518--2522",

journal = "Surface Science",

issn = "0039-6028",

publisher = "Elsevier",

number = "12",

}

TY - JOUR

T1 - In-situ measurement of molecular orientation of the pentacene ultrathin films grown on SiO2 substrates

AU - Yoshikawa, Genki

AU - Miyadera, Tetsuhiko

AU - Onoki, Ryo

AU - Ueno, Keiji

AU - Nakai, Ikuyo

AU - Entani, Shiro

AU - Ikeda, Susumu

AU - Guo, Dong

AU - Kiguchi, Manabu

AU - Kondoh, Hiroshi

AU - Ohta, Toshiaki

AU - Saiki, Koichiro

N1 - Funding Information: This work was supported by Grant-in-Aid for Creative Scientific Research (14GS0207) and for The 21st Century COE Program for Frontiers in Fundamental Chemistry from the Ministry of Education, Culture, Sports, Science and Technology. This research was performed under the approval of the Photon Factory Program Advisory Committee (proposal No. 2003G259).

PY - 2006/6/15

Y1 - 2006/6/15

N2 - Molecular orientations of pentacene ultrathin films grown on SiO2 substrates were studied without the influence of the atmosphere by vacuum atomic force microscopy (V-AFM) and near edge X-ray absorption fine structure (NEXAFS). The experimental processes from deposition of pentacene to characterization of films were performed under vacuum condition without exposure to the atmosphere. V-AFM and NEXAFS measurements showed that pentacene molecules tend to grow on SiO2 surface with their molecular long axes perpendicular to the substrate surfaces (standing-mode) irrespective of preparation procedure of SiO2 substrate.

AB - Molecular orientations of pentacene ultrathin films grown on SiO2 substrates were studied without the influence of the atmosphere by vacuum atomic force microscopy (V-AFM) and near edge X-ray absorption fine structure (NEXAFS). The experimental processes from deposition of pentacene to characterization of films were performed under vacuum condition without exposure to the atmosphere. V-AFM and NEXAFS measurements showed that pentacene molecules tend to grow on SiO2 surface with their molecular long axes perpendicular to the substrate surfaces (standing-mode) irrespective of preparation procedure of SiO2 substrate.

KW - Aromatics

KW - Atomic force microscopy

KW - In-situ characterization

KW - Near edge extended X-ray absorption fine structure (NEXAFS)

KW - Pentacene

KW - Silicon oxides

KW - Surface structure, morphology, roughness and topography

KW - Thin film structures

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DO - 10.1016/j.susc.2006.04.012

M3 - Article

AN - SCOPUS:33744992043

SN - 0039-6028

VL - 600

SP - 2518

EP - 2522

JO - Surface Science

JF - Surface Science

IS - 12

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