Influence of Na2Si2O5 on the hydration of C4AF with various surface areas

Kwang Suk You, Hirotaka Fujimori, Koji Ioku, Seishi Goto

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The hydration of C4AF having various surface areas was investigated with Na2Si2O5 solution. The hydration behavior of C4AF depended on the amount of silicate ions precipitated on its surface. The amount of precipitated silicate ions, which hindered the hydration of C4AF, was proportional to the surface area of C4AF. The precipitated silicate ions on the surface of C4AF were founded to be a silica-like material by means of X-ray photoelectron spectroscopy (XPS). They formed a layer approximately 3 nm thick on the surface of C4AF.

Original languageEnglish
Pages (from-to)64-67
Number of pages4
JournalMaterials Science Research International
Volume8
Issue number2
Publication statusPublished - 2002 Jun
Externally publishedYes

Fingerprint

Hydration
Silicates
Ions
Silicon Dioxide
X ray photoelectron spectroscopy
Silica

Keywords

  • Ferrite phase
  • Hydration reaction
  • Retardation
  • Silica layer
  • Sodium silicate
  • Surface area

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Influence of Na2Si2O5 on the hydration of C4AF with various surface areas. / You, Kwang Suk; Fujimori, Hirotaka; Ioku, Koji; Goto, Seishi.

In: Materials Science Research International, Vol. 8, No. 2, 06.2002, p. 64-67.

Research output: Contribution to journalArticle

You, Kwang Suk ; Fujimori, Hirotaka ; Ioku, Koji ; Goto, Seishi. / Influence of Na2Si2O5 on the hydration of C4AF with various surface areas. In: Materials Science Research International. 2002 ; Vol. 8, No. 2. pp. 64-67.
@article{59a0497c19bc4306af2c5bd764713c16,
title = "Influence of Na2Si2O5 on the hydration of C4AF with various surface areas",
abstract = "The hydration of C4AF having various surface areas was investigated with Na2Si2O5 solution. The hydration behavior of C4AF depended on the amount of silicate ions precipitated on its surface. The amount of precipitated silicate ions, which hindered the hydration of C4AF, was proportional to the surface area of C4AF. The precipitated silicate ions on the surface of C4AF were founded to be a silica-like material by means of X-ray photoelectron spectroscopy (XPS). They formed a layer approximately 3 nm thick on the surface of C4AF.",
keywords = "Ferrite phase, Hydration reaction, Retardation, Silica layer, Sodium silicate, Surface area",
author = "You, {Kwang Suk} and Hirotaka Fujimori and Koji Ioku and Seishi Goto",
year = "2002",
month = "6",
language = "English",
volume = "8",
pages = "64--67",
journal = "Materials Science Research International",
issn = "1341-1683",
publisher = "Chapman & Hall",
number = "2",

}

TY - JOUR

T1 - Influence of Na2Si2O5 on the hydration of C4AF with various surface areas

AU - You, Kwang Suk

AU - Fujimori, Hirotaka

AU - Ioku, Koji

AU - Goto, Seishi

PY - 2002/6

Y1 - 2002/6

N2 - The hydration of C4AF having various surface areas was investigated with Na2Si2O5 solution. The hydration behavior of C4AF depended on the amount of silicate ions precipitated on its surface. The amount of precipitated silicate ions, which hindered the hydration of C4AF, was proportional to the surface area of C4AF. The precipitated silicate ions on the surface of C4AF were founded to be a silica-like material by means of X-ray photoelectron spectroscopy (XPS). They formed a layer approximately 3 nm thick on the surface of C4AF.

AB - The hydration of C4AF having various surface areas was investigated with Na2Si2O5 solution. The hydration behavior of C4AF depended on the amount of silicate ions precipitated on its surface. The amount of precipitated silicate ions, which hindered the hydration of C4AF, was proportional to the surface area of C4AF. The precipitated silicate ions on the surface of C4AF were founded to be a silica-like material by means of X-ray photoelectron spectroscopy (XPS). They formed a layer approximately 3 nm thick on the surface of C4AF.

KW - Ferrite phase

KW - Hydration reaction

KW - Retardation

KW - Silica layer

KW - Sodium silicate

KW - Surface area

UR - http://www.scopus.com/inward/record.url?scp=0036614288&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036614288&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0036614288

VL - 8

SP - 64

EP - 67

JO - Materials Science Research International

JF - Materials Science Research International

SN - 1341-1683

IS - 2

ER -