Abstract
The polarization stability of 850-nm GaAs-based vertical-cavity surface-emitting lasers (VCSEL's) under dynamic operation was investigated by comparing the characteristics of VCSEL's grown on (311)B and (100) GaAs substrates. Significantly larger suppression ratios of the two orthogonal polarization modes was obtained for VCSEL's on (311)B substrates than those on (100) substrates under zero-bias modulation. Time-dependent orthogonal polarization suppression ratio measurements also showed that the polarization direction was more stable in the VCSEL on (311)B substrates than that on (100) substrates. Error-free transmission was realized from VCSEL's on (311)B substrates with and without a polarizer in both back-to-back and 100-m multimode fiber transmission.
Original language | English |
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Pages (from-to) | 400-402 |
Number of pages | 3 |
Journal | IEEE Photonics Technology Letters |
Volume | 11 |
Issue number | 4 |
DOIs | |
Publication status | Published - 1999 Apr |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering