Investigation of dynamic polarization stability of 850-nm GaAs-based vertical-cavity surface-emitting lasers grown on (311)B and (100) substrates

Hiroyuki Uenohara, Kouta Tateno, Toshiaki Kagawa, Yoshitaka Ohiso, Hiroyuki Tsuda, Takashi Kurokawa, Chikara Amano

Research output: Contribution to journalArticlepeer-review

18 Citations (Scopus)

Abstract

The polarization stability of 850-nm GaAs-based vertical-cavity surface-emitting lasers (VCSEL's) under dynamic operation was investigated by comparing the characteristics of VCSEL's grown on (311)B and (100) GaAs substrates. Significantly larger suppression ratios of the two orthogonal polarization modes was obtained for VCSEL's on (311)B substrates than those on (100) substrates under zero-bias modulation. Time-dependent orthogonal polarization suppression ratio measurements also showed that the polarization direction was more stable in the VCSEL on (311)B substrates than that on (100) substrates. Error-free transmission was realized from VCSEL's on (311)B substrates with and without a polarizer in both back-to-back and 100-m multimode fiber transmission.

Original languageEnglish
Pages (from-to)400-402
Number of pages3
JournalIEEE Photonics Technology Letters
Volume11
Issue number4
DOIs
Publication statusPublished - 1999 Apr 1
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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