Investigation of ferroelectric properties of vinylidene fluoride oligomer evaporated films

Kei Noda, K. Ishida, K. Mochizuki, A. Kubono, T. Horiuchi, H. Yamada, K. Matsushige

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Structures and electrical properties of newly synthesized vinylidene fluoride (VDF) oligomer [CF3(CH2CF2)17I] films evaporated onto various substrates around liquid nitrogen temperature were investigated. As a result, the VDF oligomer films were mainly formed with ferroelectric phase (form I) crystals and the molecular chains were oriented parallel to the substrate surfaces regardless of both the kind of the substrates and the thickness of the VDF oligomer films. In addition to these properties, the VDF oligomer films showed polarization reversal due to 180° rotation of the polar VDF oligomer molecules according to the applied voltages. This ferroelectric behavior was verified by local poling and piezoresponse measurements with an atomic force microscope, and by measurements of D-E hysteresis curves.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium - Proceedings
EditorsD.Y. Kaufman, S Hoffmann-Eifert, S.R. Gilbert, S Aggarwal, M Shimizu
Pages217-222
Number of pages6
Volume748
Publication statusPublished - 2003
Externally publishedYes
EventFerroelectric Thin Films XI - Boston, MA, United States
Duration: 2002 Dec 22002 Dec 5

Other

OtherFerroelectric Thin Films XI
CountryUnited States
CityBoston, MA
Period02/12/202/12/5

Fingerprint

Oligomers
Ferroelectric materials
Substrates
Liquid nitrogen
Hysteresis
Electric properties
Microscopes
1,1-difluoroethylene
Polarization
Crystals
Molecules
Electric potential
Temperature

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Noda, K., Ishida, K., Mochizuki, K., Kubono, A., Horiuchi, T., Yamada, H., & Matsushige, K. (2003). Investigation of ferroelectric properties of vinylidene fluoride oligomer evaporated films. In D. Y. Kaufman, S. Hoffmann-Eifert, S. R. Gilbert, S. Aggarwal, & M. Shimizu (Eds.), Materials Research Society Symposium - Proceedings (Vol. 748, pp. 217-222)

Investigation of ferroelectric properties of vinylidene fluoride oligomer evaporated films. / Noda, Kei; Ishida, K.; Mochizuki, K.; Kubono, A.; Horiuchi, T.; Yamada, H.; Matsushige, K.

Materials Research Society Symposium - Proceedings. ed. / D.Y. Kaufman; S Hoffmann-Eifert; S.R. Gilbert; S Aggarwal; M Shimizu. Vol. 748 2003. p. 217-222.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Noda, K, Ishida, K, Mochizuki, K, Kubono, A, Horiuchi, T, Yamada, H & Matsushige, K 2003, Investigation of ferroelectric properties of vinylidene fluoride oligomer evaporated films. in DY Kaufman, S Hoffmann-Eifert, SR Gilbert, S Aggarwal & M Shimizu (eds), Materials Research Society Symposium - Proceedings. vol. 748, pp. 217-222, Ferroelectric Thin Films XI, Boston, MA, United States, 02/12/2.
Noda K, Ishida K, Mochizuki K, Kubono A, Horiuchi T, Yamada H et al. Investigation of ferroelectric properties of vinylidene fluoride oligomer evaporated films. In Kaufman DY, Hoffmann-Eifert S, Gilbert SR, Aggarwal S, Shimizu M, editors, Materials Research Society Symposium - Proceedings. Vol. 748. 2003. p. 217-222
Noda, Kei ; Ishida, K. ; Mochizuki, K. ; Kubono, A. ; Horiuchi, T. ; Yamada, H. ; Matsushige, K. / Investigation of ferroelectric properties of vinylidene fluoride oligomer evaporated films. Materials Research Society Symposium - Proceedings. editor / D.Y. Kaufman ; S Hoffmann-Eifert ; S.R. Gilbert ; S Aggarwal ; M Shimizu. Vol. 748 2003. pp. 217-222
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