Lanthanum fluoride thin film has been prepared by vacuum thermal evaporation method. The hexagonal-phase LaF3 film has been detected by using glancing angle XRD analysis. The XPS analysis confirms the composition of lanthanum fluoride. The F- ion conduction through the grain and grain boundary has been analyzed using impedance analysis. The modulus spectra reveal the non-Debye nature and the distribution of relaxation times of the film.
- Impedance spectroscopy
- Ion conduction
- Thin films
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering