Ion conduction studies on LaF3 thin film by impedance spectroscopy

S. Selvasekarapandian, M. Vijayakumar, T. Gnanasekaran, Shinobu Fujihara, Shinnosuke Koji

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

Lanthanum fluoride thin film has been prepared by vacuum thermal evaporation method. The hexagonal-phase LaF3 film has been detected by using glancing angle XRD analysis. The XPS analysis confirms the composition of lanthanum fluoride. The F- ion conduction through the grain and grain boundary has been analyzed using impedance analysis. The modulus spectra reveal the non-Debye nature and the distribution of relaxation times of the film.

Original languageEnglish
Pages (from-to)52-57
Number of pages6
JournalPhysica B: Condensed Matter
Volume337
Issue number1-4
DOIs
Publication statusPublished - 2003 Sep 1

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Keywords

  • Impedance spectroscopy
  • Ion conduction
  • LaF
  • Thin films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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