Id fluctuations by stochastic single-hole trappings in high-κ dielectric p-MOSFETs

Shigeki Kobayashi, Masumi Saitoh, Ken Uchida

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    15 Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'I<sub>d</sub> fluctuations by stochastic single-hole trappings in high-κ dielectric p-MOSFETs'. Together they form a unique fingerprint.

    Engineering & Materials Science