Lattice continuity at interface of alumina-coated transition metals

Tomohiro Saito, Yuichi Ikuhara, Kunio Shibuki, Tetsuya Suzuki

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Abstract

Interfaces of alumina-coated transition metals were studied by cross-sectional high-resolution electron microscopy (HREM) to investigate the lattice continuity across the interface, a-alumina films 2-3 am in thickness were coated on vanadium, niobium and tantalum polycrystals by the sputtering method. Cross-sectional HREM observations showed that there was a three-dimensional orientation relationship (3-D OR) between a-alumina films and substrate transition metals. The 3-D OR is discussed based on the coincidence of reciprocal lattice points of two adjoining crystals.

Original languageEnglish
Pages (from-to)L1301-L1304
JournalJapanese journal of applied physics
Volume34
Issue number10
DOIs
Publication statusPublished - 1995 Oct
Externally publishedYes

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Keywords

  • A-alumina
  • Coating
  • High-resolution electron microscopy
  • Interface
  • Reciprocal lattice
  • Sputtering
  • Three-dimensional orientation relationship
  • Transition metals

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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