Lattice continuity at interface of alumina-coated transition metals

T. Saito, Y. Ikuhara, K. Shibuki, Tetsuya Suzuki

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Interfaces of alumina-coated transition metals were studied by cross-sectional high-resolution electron microscopy (HREM) to investigate the lattice continuity across the interface. α-alumina films 2-3 μm in thickness were coated on vanadium, niobium and tantalum polycrystals by the sputtering method. Cross-sectional HREM observations showed that there was a three-dimensional orientation relationship (3-D OR) between α-alumina films and substrate transition metals. The 3-D OR is discussed based on the coincidence of reciprocal lattice points of two adjoining crystals.

Original languageEnglish
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume34
Issue number10 A
Publication statusPublished - 1995 Oct 1
Externally publishedYes

Fingerprint

continuity
Transition metals
Alumina
aluminum oxides
High resolution electron microscopy
transition metals
electron microscopy
high resolution
Polycrystals
Tantalum
polycrystals
tantalum
Niobium
Crystal lattices
niobium
Vanadium
vanadium
Sputtering
sputtering
Crystals

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Lattice continuity at interface of alumina-coated transition metals. / Saito, T.; Ikuhara, Y.; Shibuki, K.; Suzuki, Tetsuya.

In: Japanese Journal of Applied Physics, Part 2: Letters, Vol. 34, No. 10 A, 01.10.1995.

Research output: Contribution to journalArticle

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