Load dependency measurement of IPS cell-derived cardiomyocytes' contraction

Kenei Matsudaira, Hidetoshi Takahashi, Kayoko Hirayama Shoji, Thanh Vinh Nguyen, Takuya Tsukagoshi, Isao Shimoyama

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In this paper, we propose a method to evaluate relationships between twitch forces and static stretch stimuli of iPS cell-derived cardiomyocytes (iPSC-CMs) (force-length relation). The method realized the twitch force measurement of iPSC-CMs statically stretched under the culturing condition. As a result, twitch forces of a few tens of μΝ were measured, and the variation of twitch forces was observed as the static stretch was increased.

Original languageEnglish
Title of host publication2018 IEEE Micro Electro Mechanical Systems, MEMS 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages129-132
Number of pages4
ISBN (Electronic)9781538647820
DOIs
Publication statusPublished - 2018 Apr 24
Externally publishedYes
Event31st IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2018 - Belfast, United Kingdom
Duration: 2018 Jan 212018 Jan 25

Publication series

NameProceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
Volume2018-January
ISSN (Print)1084-6999

Other

Other31st IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2018
CountryUnited Kingdom
CityBelfast
Period18/1/2118/1/25

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanical Engineering
  • Electrical and Electronic Engineering

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  • Cite this

    Matsudaira, K., Takahashi, H., Shoji, K. H., Nguyen, T. V., Tsukagoshi, T., & Shimoyama, I. (2018). Load dependency measurement of IPS cell-derived cardiomyocytes' contraction. In 2018 IEEE Micro Electro Mechanical Systems, MEMS 2018 (pp. 129-132). (Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS); Vol. 2018-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MEMSYS.2018.8346500