Local structure of epitaxial GeTe and Ge2Sb2Te5 films grown on InAs and Si substrates with (100) and (111) orientations: An x-ray absorption near-edge structure study

A. V. Kolobov, P. Fons, M. Krbal, J. Tominaga, A. Giussani, K. Perumal, H. Riechert, R. Calarco, T. Uruga

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Physics & Astronomy