Low complexity metric for joint MLD in overloaded MIMO system

Takayoshi Aoki, Yukitoshi Sanada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

This paper presents a low complexity metric for joint maximum-likelihood detection (MLD) in overloaded multiple-input multiple-output (MIMO)-orthogonal frequency division multiplexing (OFDM) systems. In overloaded MIMO systems, a nonlinear detection scheme such as MLD combined with error correction coding achieves superior performance than that of a single signal stream with higher order modulation. However, MLD demands large computational complexity because of multiplications in the selection of candidate signal points. Thus, a Manhattan metric has been used to reduce the complexity. Nevertheless, it is not accurate and causes performance degradation in overloaded MIMO systems. Thus, this paper proposes a new metric that is calculated with summations and bit shifts. New numerical results obtained through computer simulation show that the proposed metric improves bit error rate (BER) performance more than 0.2dB at the BER of 10-4 in comparison with a Manhattan metric.

Original languageEnglish
Title of host publication2015 IEEE 82nd Vehicular Technology Conference, VTC Fall 2015 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479980918
DOIs
Publication statusPublished - 2016 Jan 25
Event82nd IEEE Vehicular Technology Conference, VTC Fall 2015 - Boston, United States
Duration: 2015 Sep 62015 Sep 9

Other

Other82nd IEEE Vehicular Technology Conference, VTC Fall 2015
CountryUnited States
CityBoston
Period15/9/615/9/9

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ASJC Scopus subject areas

  • Computer Networks and Communications
  • Automotive Engineering
  • Hardware and Architecture

Cite this

Aoki, T., & Sanada, Y. (2016). Low complexity metric for joint MLD in overloaded MIMO system. In 2015 IEEE 82nd Vehicular Technology Conference, VTC Fall 2015 - Proceedings [7391012] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VTCFall.2015.7391012