Low Complexity Metric Function for Gibbs Sampling MIMO Detection

Yutaro Kobayashi, Yukitoshi Sanada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, a metric function for Gibbs sampling multiple-input multiple-output (MIMO) detection is proposed. In conventional Gibbs sampling MIMO detection, an exponential function is used in the calculation of a metric for the selection of candidate symbols. However, the exponential function can be implemented by a look-up table and may require a large amount of memory. This paper proposes a metric function based on a simple fraction. The proposed metric substitutes the exponential function though it increases the number of multiplication operations. It is shown by numerical results obtained through computer simulation that the proposed metric function improves the performance under a high signal-to-noise ratio condition in a large scale MIMO system since its curve is close to that of the exponential function when an input metric distance approaches to zero.

Original languageEnglish
Title of host publication2018 IEEE 88th Vehicular Technology Conference, VTC-Fall 2018 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538663585
DOIs
Publication statusPublished - 2019 Apr 12
Event88th IEEE Vehicular Technology Conference, VTC-Fall 2018 - Chicago, United States
Duration: 2018 Aug 272018 Aug 30

Publication series

NameIEEE Vehicular Technology Conference
Volume2018-August
ISSN (Print)1550-2252

Conference

Conference88th IEEE Vehicular Technology Conference, VTC-Fall 2018
CountryUnited States
CityChicago
Period18/8/2718/8/30

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ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Applied Mathematics

Cite this

Kobayashi, Y., & Sanada, Y. (2019). Low Complexity Metric Function for Gibbs Sampling MIMO Detection. In 2018 IEEE 88th Vehicular Technology Conference, VTC-Fall 2018 - Proceedings [8690983] (IEEE Vehicular Technology Conference; Vol. 2018-August). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VTCFall.2018.8690983