Low frequency spurs of VCO due to noise propagation from digital I/O's and their effects on performance of Bluetooth SoC

Shouhei Kousai, Kenichi Agawa, Hiroki Ishikuro, Hideaki Majima, Hiroyuki Kobayashi, Daisuke Miyashita, Takahisa Yoshino, Youichi Hama, Mototsugu Hamada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

This paper describes the effect of digital noise on RF circuits on the singlechip Bluetooth SoC. Low frequency components in the digital noise, generated by I/O circuits accessing to an external memory, are found to be converted to the phase noise as the spurs of voltage controlled oscillator (VCO). The spurs bring the performance degradation of wireless communications systems. To manage the gain of the VCO and the coupling coefficient is shown to be a key to mitigate the performance degradations.

Original languageEnglish
Title of host publicationDigest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
EditorsA. Jerng
Pages589-592
Number of pages4
DOIs
Publication statusPublished - 2005
Externally publishedYes
Event2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers - Long Beach, CA, United States
Duration: 2005 Jun 122005 Jun 14

Other

Other2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers
CountryUnited States
CityLong Beach, CA
Period05/6/1205/6/14

Fingerprint

Bluetooth
Variable frequency oscillators
Degradation
Networks (circuits)
Phase noise
Communication systems
Data storage equipment
System-on-chip

Keywords

  • Bluetooth SoC
  • Digital noise
  • Phase noise
  • VCO

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Kousai, S., Agawa, K., Ishikuro, H., Majima, H., Kobayashi, H., Miyashita, D., ... Hamada, M. (2005). Low frequency spurs of VCO due to noise propagation from digital I/O's and their effects on performance of Bluetooth SoC. In A. Jerng (Ed.), Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium (pp. 589-592). [RTUIFR-12] https://doi.org/10.1109/RFIC.2005.1489882

Low frequency spurs of VCO due to noise propagation from digital I/O's and their effects on performance of Bluetooth SoC. / Kousai, Shouhei; Agawa, Kenichi; Ishikuro, Hiroki; Majima, Hideaki; Kobayashi, Hiroyuki; Miyashita, Daisuke; Yoshino, Takahisa; Hama, Youichi; Hamada, Mototsugu.

Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium. ed. / A. Jerng. 2005. p. 589-592 RTUIFR-12.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kousai, S, Agawa, K, Ishikuro, H, Majima, H, Kobayashi, H, Miyashita, D, Yoshino, T, Hama, Y & Hamada, M 2005, Low frequency spurs of VCO due to noise propagation from digital I/O's and their effects on performance of Bluetooth SoC. in A Jerng (ed.), Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium., RTUIFR-12, pp. 589-592, 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers, Long Beach, CA, United States, 05/6/12. https://doi.org/10.1109/RFIC.2005.1489882
Kousai S, Agawa K, Ishikuro H, Majima H, Kobayashi H, Miyashita D et al. Low frequency spurs of VCO due to noise propagation from digital I/O's and their effects on performance of Bluetooth SoC. In Jerng A, editor, Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium. 2005. p. 589-592. RTUIFR-12 https://doi.org/10.1109/RFIC.2005.1489882
Kousai, Shouhei ; Agawa, Kenichi ; Ishikuro, Hiroki ; Majima, Hideaki ; Kobayashi, Hiroyuki ; Miyashita, Daisuke ; Yoshino, Takahisa ; Hama, Youichi ; Hamada, Mototsugu. / Low frequency spurs of VCO due to noise propagation from digital I/O's and their effects on performance of Bluetooth SoC. Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium. editor / A. Jerng. 2005. pp. 589-592
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