Low frequency spurs of VCO due to noise propagation from digital I/O's and their effects on performance of Bluetooth SoC

Shouhei Kousai, Kenichi Agawa, Hiroki Ishikuro, Hideaki Majima, Hiroyuki Kobayashi, Daisuke Miyashita, Takahisa Yoshino, Youichi Hama, Mototsugu Hamada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

This paper describes the effect of digital noise on RF circuits on the singlechip Bluetooth SoC. Low frequency components in the digital noise, generated by I/O circuits accessing to an external memory, are found to be converted to the phase noise as the spurs of voltage controlled oscillator (VCO). The spurs bring the performance degradation of wireless communications systems. To manage the gain of the VCO and the coupling coefficient is shown to be a key to mitigate the performance degradations.

Original languageEnglish
Title of host publication2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers
EditorsA. Jerng
Pages589-592
Number of pages4
DOIs
Publication statusPublished - 2005 Nov 15
Externally publishedYes
Event2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers - Long Beach, CA, United States
Duration: 2005 Jun 122005 Jun 14

Publication series

NameDigest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
ISSN (Print)1529-2517

Other

Other2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers
CountryUnited States
CityLong Beach, CA
Period05/6/1205/6/14

Keywords

  • Bluetooth SoC
  • Digital noise
  • Phase noise
  • VCO

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Kousai, S., Agawa, K., Ishikuro, H., Majima, H., Kobayashi, H., Miyashita, D., Yoshino, T., Hama, Y., & Hamada, M. (2005). Low frequency spurs of VCO due to noise propagation from digital I/O's and their effects on performance of Bluetooth SoC. In A. Jerng (Ed.), 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers (pp. 589-592). [RTUIFR-12] (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium). https://doi.org/10.1109/RFIC.2005.1489882