Magnetoresistive measurement of switching behavior in nano-structured magnetic dot arrays

K. Matsuyama, Yukio Nozaki, T. Misumi

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

In the present study, geometrical and thermal effects in a mesoscopic magnetization reversal process have been studied on a novel nano-structure of magnetic relief dot with magnetoresistive measurements. Only the top layer of a substrate/CoPt(10 nm)/Cu(10 nm)/NiFe(6, 12 nm) film was structured into rectangular dots with various lengths (L) and widths (W) down to 0.2 μm. Coercive fields of NiFe relief dots (W = 0.2 μm) systematically decrease with the decrease of L/W, as predicted from demagnetizing factors in single domain particle. About 50% reduction of Hc due to a temperature rise, from 5 to 300 K, demonstrates considerable thermal activation in the magnetization reversal of nano-structured magnetic particles.

Original languageEnglish
Pages (from-to)11-13
Number of pages3
JournalJournal of Magnetism and Magnetic Materials
Volume240
Issue number1-3
DOIs
Publication statusPublished - 2002 Feb
Externally publishedYes

Fingerprint

Magnetization reversal
magnetization
Thermal effects
temperature effects
Chemical activation
activation
Substrates
Temperature
temperature
Hot Temperature

Keywords

  • Magnetization patterns
  • Magnetization reversal
  • Magnetoresistance, giant
  • Thin films, trilayer

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Magnetoresistive measurement of switching behavior in nano-structured magnetic dot arrays. / Matsuyama, K.; Nozaki, Yukio; Misumi, T.

In: Journal of Magnetism and Magnetic Materials, Vol. 240, No. 1-3, 02.2002, p. 11-13.

Research output: Contribution to journalArticle

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