TY - GEN
T1 - Measurement of elliptically-polarized E-field waveforms in mid infrared range by electro-optic sampling
AU - Oguchi, Kenichi
AU - Kurihara, Takayuki
AU - Fischer, Marco
AU - Watanabe, Shinichi
AU - Brida, Daniele
N1 - Funding Information:
This work is partially supported by Japan Society for the Promotion of Science (JSPS) KAKENHI (JP17J04085). T.K is thankful for the support from Overseas Research Fellowship from Japan Society for the Promotion of Science (JSPS).
Publisher Copyright:
© 2018 OSA - The Optical Society. All rights reserved.
PY - 2018
Y1 - 2018
N2 - Electro-optic sampling (EOS) is a technique widely used to measure electric field waveform in ultra-broadband frequency range from terahertz (THz), mid- (MIR) [1], and near infrared (NIR) [2]. Since EOS signal depends on the relative orientations between probe, THz and crystal axis, the modulation of EOS signal upon crystal rotation provides polarization information of the infrared pulses [3, 4]. This so-called polarization-sensitive (PS-) EOS has an advantage that no additional polarization optics such as wire-grid polarizer is needed to measure polarization. In this talk we extend PS-EOS for the first time to the MIR region, wherein fruitful application possibilities such as vibrational circular dichroism [5] are expected.
AB - Electro-optic sampling (EOS) is a technique widely used to measure electric field waveform in ultra-broadband frequency range from terahertz (THz), mid- (MIR) [1], and near infrared (NIR) [2]. Since EOS signal depends on the relative orientations between probe, THz and crystal axis, the modulation of EOS signal upon crystal rotation provides polarization information of the infrared pulses [3, 4]. This so-called polarization-sensitive (PS-) EOS has an advantage that no additional polarization optics such as wire-grid polarizer is needed to measure polarization. In this talk we extend PS-EOS for the first time to the MIR region, wherein fruitful application possibilities such as vibrational circular dichroism [5] are expected.
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M3 - Conference contribution
AN - SCOPUS:85065858631
SN - 9784863486942
T3 - Optics InfoBase Conference Papers
BT - JSAP-OSA Joint Symposia, JSAP 2018
PB - OSA - The Optical Society
T2 - JSAP-OSA Joint Symposia, JSAP 2018
Y2 - 18 September 2018 through 21 September 2018
ER -