Measurement of elliptically-polarized E-field waveforms in mid infrared range by electro-optic sampling

Kenichi Oguchi, Takayuki Kurihara, Marco Fischer, Shinichi Watanabe, Daniele Brida

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Electro-optic sampling (EOS) is a technique widely used to measure electric field waveform in ultra-broadband frequency range from terahertz (THz), mid- (MIR) [1], and near infrared (NIR) [2]. Since EOS signal depends on the relative orientations between probe, THz and crystal axis, the modulation of EOS signal upon crystal rotation provides polarization information of the infrared pulses [3, 4]. This so-called polarization-sensitive (PS-) EOS has an advantage that no additional polarization optics such as wire-grid polarizer is needed to measure polarization. In this talk we extend PS-EOS for the first time to the MIR region, wherein fruitful application possibilities such as vibrational circular dichroism [5] are expected.

Original languageEnglish
Title of host publicationJSAP-OSA Joint Symposia, JSAP 2018
PublisherOSA - The Optical Society
ISBN (Electronic)9781557528209
Publication statusPublished - 2018 Jan 1
EventJSAP-OSA Joint Symposia, JSAP 2018 - Nagoya, Japan
Duration: 2018 Sep 182018 Sep 21

Publication series

NameOptics InfoBase Conference Papers
VolumePart F125-JSAP 2018

Conference

ConferenceJSAP-OSA Joint Symposia, JSAP 2018
CountryJapan
CityNagoya
Period18/9/1818/9/21

Fingerprint

Electrooptical effects
Sampling
Infrared radiation
Signal sampling
Polarization
Crystals
Crystal orientation
Optics
Electric fields
Modulation
Wire

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

Cite this

Oguchi, K., Kurihara, T., Fischer, M., Watanabe, S., & Brida, D. (2018). Measurement of elliptically-polarized E-field waveforms in mid infrared range by electro-optic sampling. In JSAP-OSA Joint Symposia, JSAP 2018 (Optics InfoBase Conference Papers; Vol. Part F125-JSAP 2018). OSA - The Optical Society.

Measurement of elliptically-polarized E-field waveforms in mid infrared range by electro-optic sampling. / Oguchi, Kenichi; Kurihara, Takayuki; Fischer, Marco; Watanabe, Shinichi; Brida, Daniele.

JSAP-OSA Joint Symposia, JSAP 2018. OSA - The Optical Society, 2018. (Optics InfoBase Conference Papers; Vol. Part F125-JSAP 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Oguchi, K, Kurihara, T, Fischer, M, Watanabe, S & Brida, D 2018, Measurement of elliptically-polarized E-field waveforms in mid infrared range by electro-optic sampling. in JSAP-OSA Joint Symposia, JSAP 2018. Optics InfoBase Conference Papers, vol. Part F125-JSAP 2018, OSA - The Optical Society, JSAP-OSA Joint Symposia, JSAP 2018, Nagoya, Japan, 18/9/18.
Oguchi K, Kurihara T, Fischer M, Watanabe S, Brida D. Measurement of elliptically-polarized E-field waveforms in mid infrared range by electro-optic sampling. In JSAP-OSA Joint Symposia, JSAP 2018. OSA - The Optical Society. 2018. (Optics InfoBase Conference Papers).
Oguchi, Kenichi ; Kurihara, Takayuki ; Fischer, Marco ; Watanabe, Shinichi ; Brida, Daniele. / Measurement of elliptically-polarized E-field waveforms in mid infrared range by electro-optic sampling. JSAP-OSA Joint Symposia, JSAP 2018. OSA - The Optical Society, 2018. (Optics InfoBase Conference Papers).
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