Measurement of plasmon response functions of nanostructures with femtosecond laser cross-correlation microscopy toward spatiotemporal plasmon control

Jun Oi, Shutaro Onishi, Keiichiro Matsuishi, Takuya Harada, Fumihiko Kannari

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    The localized plasmon resonance at noble metal nanostructures has been devoting much attention to produce an interaction platform between light and matter at nanometer size. Currently, spatiotemporal control over localized plasmon was demonstrated using a vector pulse shaping technique for femtosecond lasers [1]. In order to achieve deterministic control for localized plasmon or surface plasmon-polariton (SPP) at nanostructures, temporal characterization of femtosecond plasmon is highly required. So far, temporal characterization of ultrafast plasmon using PEEM has been reported [1,2]. We apply a new characterization method of ultrafast plasmon: electrical-field cross-correlation imaging using femtosecond laser dark-field microscopy or SNOM. We set our research goal at spatiotemporal control of plasmon or SPP generated by ultra-broadband laser pulses, which are shaped based on the plasmon response function [3] measured with our novel methods.

    Original languageEnglish
    Title of host publication2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011
    DOIs
    Publication statusPublished - 2011 Sep 6
    Event2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011 - Munich, Germany
    Duration: 2011 May 222011 May 26

    Publication series

    Name2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011

    Other

    Other2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011
    CountryGermany
    CityMunich
    Period11/5/2211/5/26

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

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