Measurement of the ferromagnetic resonance of a single micron dot by using a vector network analyzer

Kazuto Yamanoi, Takashi Manago, Satoshi Yakata, Takashi Kimura

Research output: Contribution to journalArticle

Abstract

The ferromagnetic resonance of a single micron-scale dot of permalloy was measured by using a vector network analyzer. The resonant frequency shifted to higher frequency with increasing aspect ratio of the sample. This tendency was remarkable for narrower width samples, especially the 1-μm-width dots. This means that the demagnetization effect of thin films for the ferromagnetic resonance becomes large when the sample width is less than 1 μm. The resonant frequency can be largely controlled by changing the sample width for a thin film with a width of less than 1 μm, which is a favorable characteristics for various microwave applications.

Original languageEnglish
Pages (from-to)800-803
Number of pages4
JournalJournal of the Korean Physical Society
Volume63
Issue number3
DOIs
Publication statusPublished - 2013 Aug 1
Externally publishedYes

Fingerprint

ferromagnetic resonance
analyzers
resonant frequencies
Permalloys (trademark)
demagnetization
thin films
aspect ratio
tendencies
microwaves

Keywords

  • Ferromagnetic resonance
  • Magnetic dot
  • Vector network analyzer

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Measurement of the ferromagnetic resonance of a single micron dot by using a vector network analyzer. / Yamanoi, Kazuto; Manago, Takashi; Yakata, Satoshi; Kimura, Takashi.

In: Journal of the Korean Physical Society, Vol. 63, No. 3, 01.08.2013, p. 800-803.

Research output: Contribution to journalArticle

@article{31c596b17a2e4162be40708d05fed0ec,
title = "Measurement of the ferromagnetic resonance of a single micron dot by using a vector network analyzer",
abstract = "The ferromagnetic resonance of a single micron-scale dot of permalloy was measured by using a vector network analyzer. The resonant frequency shifted to higher frequency with increasing aspect ratio of the sample. This tendency was remarkable for narrower width samples, especially the 1-μm-width dots. This means that the demagnetization effect of thin films for the ferromagnetic resonance becomes large when the sample width is less than 1 μm. The resonant frequency can be largely controlled by changing the sample width for a thin film with a width of less than 1 μm, which is a favorable characteristics for various microwave applications.",
keywords = "Ferromagnetic resonance, Magnetic dot, Vector network analyzer",
author = "Kazuto Yamanoi and Takashi Manago and Satoshi Yakata and Takashi Kimura",
year = "2013",
month = "8",
day = "1",
doi = "10.3938/jkps.63.800",
language = "English",
volume = "63",
pages = "800--803",
journal = "Journal of the Korean Physical Society",
issn = "0374-4884",
publisher = "Korean Physical Society",
number = "3",

}

TY - JOUR

T1 - Measurement of the ferromagnetic resonance of a single micron dot by using a vector network analyzer

AU - Yamanoi, Kazuto

AU - Manago, Takashi

AU - Yakata, Satoshi

AU - Kimura, Takashi

PY - 2013/8/1

Y1 - 2013/8/1

N2 - The ferromagnetic resonance of a single micron-scale dot of permalloy was measured by using a vector network analyzer. The resonant frequency shifted to higher frequency with increasing aspect ratio of the sample. This tendency was remarkable for narrower width samples, especially the 1-μm-width dots. This means that the demagnetization effect of thin films for the ferromagnetic resonance becomes large when the sample width is less than 1 μm. The resonant frequency can be largely controlled by changing the sample width for a thin film with a width of less than 1 μm, which is a favorable characteristics for various microwave applications.

AB - The ferromagnetic resonance of a single micron-scale dot of permalloy was measured by using a vector network analyzer. The resonant frequency shifted to higher frequency with increasing aspect ratio of the sample. This tendency was remarkable for narrower width samples, especially the 1-μm-width dots. This means that the demagnetization effect of thin films for the ferromagnetic resonance becomes large when the sample width is less than 1 μm. The resonant frequency can be largely controlled by changing the sample width for a thin film with a width of less than 1 μm, which is a favorable characteristics for various microwave applications.

KW - Ferromagnetic resonance

KW - Magnetic dot

KW - Vector network analyzer

UR - http://www.scopus.com/inward/record.url?scp=84883034209&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84883034209&partnerID=8YFLogxK

U2 - 10.3938/jkps.63.800

DO - 10.3938/jkps.63.800

M3 - Article

AN - SCOPUS:84883034209

VL - 63

SP - 800

EP - 803

JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

SN - 0374-4884

IS - 3

ER -