Measurement of the ferromagnetic resonance of a single micron dot by using a vector network analyzer

Kazuto Yamanoi, Takashi Manago, Satoshi Yakata, Takashi Kimura

Research output: Contribution to journalArticle

Abstract

The ferromagnetic resonance of a single micron-scale dot of permalloy was measured by using a vector network analyzer. The resonant frequency shifted to higher frequency with increasing aspect ratio of the sample. This tendency was remarkable for narrower width samples, especially the 1-μm-width dots. This means that the demagnetization effect of thin films for the ferromagnetic resonance becomes large when the sample width is less than 1 μm. The resonant frequency can be largely controlled by changing the sample width for a thin film with a width of less than 1 μm, which is a favorable characteristics for various microwave applications.

Original languageEnglish
Pages (from-to)800-803
Number of pages4
JournalJournal of the Korean Physical Society
Volume63
Issue number3
DOIs
Publication statusPublished - 2013 Aug 1
Externally publishedYes

Keywords

  • Ferromagnetic resonance
  • Magnetic dot
  • Vector network analyzer

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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