Measurement of total hemispherical emittance at cryogenic temperatures

Tohru Furusawa; Yuji Nagasaka; Akira Ohnishi

doi:10.4271/961430

Measurement of total hemispherical emittance at cryogenic temperatures

Tohru Furusawa, Yuji Nagasaka, Akira Ohnishi

Department of System Design Engineering

Research output: Contribution to journal › Conference article › peer-review

Abstract

A method for measurement of total hemispherical emittance of metals at cryogenic temperatures is described. The principle of the measurement is based on calorimetric method and total hemispherical emittance as a function of temperature is obtained by measuring the equilibrium temperature of a specimen corresponding to different heat input, which is given to a heater attached to the specimen. Measurements of total hemispherical emittance and specific heat have been carried out on the specimen of lead over a temperature range of 10∼40 K. In order to verify the measurement method, uncertainty on heat loss is discussed.

Original language	English
Journal	SAE Technical Papers
DOIs	https://doi.org/10.4271/961430
Publication status	Published - 1996 Jan 1
Event	26th International Conference on Environmental Systems - Monterey, CA, United States Duration: 1996 Jul 8 → 1996 Jul 11

ASJC Scopus subject areas

Automotive Engineering
Safety, Risk, Reliability and Quality
Pollution
Industrial and Manufacturing Engineering

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abstract = "A method for measurement of total hemispherical emittance of metals at cryogenic temperatures is described. The principle of the measurement is based on calorimetric method and total hemispherical emittance as a function of temperature is obtained by measuring the equilibrium temperature of a specimen corresponding to different heat input, which is given to a heater attached to the specimen. Measurements of total hemispherical emittance and specific heat have been carried out on the specimen of lead over a temperature range of 10∼40 K. In order to verify the measurement method, uncertainty on heat loss is discussed.",

author = "Tohru Furusawa and Yuji Nagasaka and Akira Ohnishi",

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doi = "10.4271/961430",

language = "English",

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T1 - Measurement of total hemispherical emittance at cryogenic temperatures

AU - Furusawa, Tohru

AU - Nagasaka, Yuji

AU - Ohnishi, Akira

PY - 1996/1/1

Y1 - 1996/1/1

N2 - A method for measurement of total hemispherical emittance of metals at cryogenic temperatures is described. The principle of the measurement is based on calorimetric method and total hemispherical emittance as a function of temperature is obtained by measuring the equilibrium temperature of a specimen corresponding to different heat input, which is given to a heater attached to the specimen. Measurements of total hemispherical emittance and specific heat have been carried out on the specimen of lead over a temperature range of 10∼40 K. In order to verify the measurement method, uncertainty on heat loss is discussed.

AB - A method for measurement of total hemispherical emittance of metals at cryogenic temperatures is described. The principle of the measurement is based on calorimetric method and total hemispherical emittance as a function of temperature is obtained by measuring the equilibrium temperature of a specimen corresponding to different heat input, which is given to a heater attached to the specimen. Measurements of total hemispherical emittance and specific heat have been carried out on the specimen of lead over a temperature range of 10∼40 K. In order to verify the measurement method, uncertainty on heat loss is discussed.

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U2 - 10.4271/961430

DO - 10.4271/961430

M3 - Conference article

AN - SCOPUS:85072486267

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SN - 0148-7191

T2 - 26th International Conference on Environmental Systems

Y2 - 8 July 1996 through 11 July 1996

ER -

Measurement of total hemispherical emittance at cryogenic temperatures

Abstract

ASJC Scopus subject areas

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